Angle- and polarization-adaptive aperiodic-anisotropic metasurfaces for broadband reflectance suppression

Optical reflectance at the air-silicon interface degrades CMOS image sensor (CIS) performance, causing signal loss and image artifacts. Conventional single-layer anti-reflective coatings (1-ARCs) offer CMOS-compatible simplicity, but their isotropic nature and limited spatial tunability make them poorly suited to handle angle- and polarization-dependent characteristics of incident light, particularly where the chief-ray angle varies across the sensor surface. Here, we present an aperiodic-anisotropic metasurface (AAM) composed of subwavelength TiO 2 nanodisks with spatially varying geometric anisotropy, enabling broadband, angle- and polarization-resolved impedance matching tailored to local incidence conditions. Its performance was verified through unit-cell-level optimization and further validated by full-area simulations on a 20 × 20 μm 2 Si substrate under Gaussian beam illumination, where the AAM achieved ∼1.40% average reflectance across 400–700 nm for both polarizations, outperforming conventional 1-ARC and double-layer anti-reflective coating (2-ARC). This offers a practical solution for CIS and other systems such as LiDAR (light detection and ranging) receivers under spatially varying illumination.