Oxygen-Activated Surface Chemistry Enabling Low-Temperature CVD of RuS <sub>2</sub> for Broadband Photodetectors

Ruthenium sulfide (RuS 2 ) is a promising channel material for light detection because of its high carrier mobility, suitable bandgap, and long-term stability. However, conventional synthesis requires high temperatures and predominantly yields nanoparticle-based structures, which are unsuitable for optoelectronic devices. In this work, we demonstrate the direct growth of high-quality RuS 2 films at a remarkably low temperature of 300 °C, enabled by an O 2 coinjection strategy during chemical vapor deposition (CVD). Systematic characterization reveals that O 2 plays a critical role in facilitating low-temperature growth while suppressing metallic Ru or RuO 2 formation. Machine-learning interatomic potential (MLIP)-based theoretical analysis on surface reactions reveals that slightly oxidized RuS 2 surfaces formed under O 2 /H 2 S coinjection enhance H 2 S activation, surface reactivity, and precursor-ligand elimination, thereby supporting low-temperature RuS 2 CVD growth. Consequently, the O 2 -assisted process yields phase-pure, polycrystalline RuS 2 films with minimal oxygen incorporation. Metal–semiconductor–metal (MSM) RuS 2 photodetectors exhibit broadband photoresponse across the visible to near-infrared (NIR) region, very low dark current (∼1.7 nA), and high responsivity, along with fast response times (47/65 μs) and excellent stability. These findings demonstrate that O 2 -assisted CVD provides a robust, low-temperature route for synthesizing RuS 2 thin films and highlight their potential for next-generation optoelectronic applications.

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Journal
Chemistry of Materials
Published
2026-07-17
DOI
https://doi.org/10.1021/acs.chemmater.6c00432
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
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article

Oxygen-Activated Surface Chemistry Enabling Low-Temperature CVD of RuS 2 for Broadband Photodetectors

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Chemistry of Materials
Chalcogenide Semiconductor Thin Films
article

Oxygen-Activated Surface Chemistry Enabling Low-Temperature CVD of RuS 2 for Broadband Photodetectors

Tatsuya Nakazawa, Jaehyeok Kim, Iaan Cho, Yusuke Ohshima, Seunggi Seo, Bonggeun Shong, Hyungjun Kim, Jisang Yoo, Donghyun Kim, Minji Kim, Hiroki Sato
article en

Abstract

Ruthenium sulfide (RuS 2 ) is a promising channel material for light detection because of its high carrier mobility, suitable bandgap, and long-term stability. However, conventional synthesis requires high temperatures and predominantly yields nanoparticle-based structures, which are unsuitable for optoelectronic devices. In this work, we demonstrate the direct growth of high-quality RuS 2 films at a remarkably low temperature of 300 °C, enabled by an O 2 coinjection strategy during chemical vapor deposition (CVD). Systematic characterization reveals that O 2 plays a critical role in facilitating low-temperature growth while suppressing metallic Ru or RuO 2 formation. Machine-learning interatomic potential (MLIP)-based theoretical analysis on surface reactions reveals that slightly oxidized RuS 2 surfaces formed under O 2 /H 2 S coinjection enhance H 2 S activation, surface reactivity, and precursor-ligand elimination, thereby supporting low-temperature RuS 2 CVD growth. Consequently, the O 2 -assisted process yields phase-pure, polycrystalline RuS 2 films with minimal oxygen incorporation. Metal–semiconductor–metal (MSM) RuS 2 photodetectors exhibit broadband photoresponse across the visible to near-infrared (NIR) region, very low dark current (∼1.7 nA), and high responsivity, along with fast response times (47/65 μs) and excellent stability. These findings demonstrate that O 2 -assisted CVD provides a robust, low-temperature route for synthesizing RuS 2 thin films and highlight their potential for next-generation optoelectronic applications.

Chemistry of Materials
Yonsei University (KR), ASM International (Belgium) (BE), Tsukuba Medical Center Hospital (JP), Targazyme (United States) (US), Materials Technologies (United States) (US), Hanyang University (KR)
National Research Foundation of Korea
Affordable and clean energy
Openalex Percentile: Top 15%
Chalcogenide Semiconductor Thin Films
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