GREClue: Failure Indexing with Graph-Based Failure Representation and Entropy-Based Deep Clustering

Failure indexing aims to group multiple failures according to their root causes and is an essential step in parallel debugging. Failure indexing consists mainly of two steps: failure representation and failure clustering. While many research efforts have been devoted to these two steps, serious issues still exist. For failure representation, existing works use coverage or program memory information, which unfortunately can not capture deep failure semantic. For failure clustering, advanced failure indexing methods use clustering algorithms with preset cluster centers, but this kind of clustering algorithm can handle spherical clusters well but performs poorly when handling clusters of other shapes. To address these issues, this paper proposes GREClue, a novel failure indexing approach with Graph-based failure Representation and Entropy-based deep Clustering. GREClue overcomes the issues in order. For failure representation, GREClue designs the failure semantic graph (FSG), a new graph representation that effectively contains semantic information and runtime information of failures. Based on FSG, GREClue further consists of an entropy-based deep clustering component, which can accurately cluster failed tests without presetting cluster centers. An extensive evaluation of GREClue shows that compared to the state-of-the-art failure indexing method, GREClue improves both the performance of estimating the number of faults and the clustering effectiveness by 10% to 41%. Moreover, it has also been shown that GREClue can effectively facilitate parallel debugging.

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Publication Details

Journal
Proceedings of the ACM on software engineering.
Published
2026-06-30
DOI
https://doi.org/10.1145/3808118
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00

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article

GREClue: Failure Indexing with Graph-Based Failure Representation and Entropy-Based Deep Clustering

Zhongxing Yu, Zhenyu Yang
Proceedings of the ACM on software engineering.
VLSI and Analog Circuit Testing
article

GREClue: Failure Indexing with Graph-Based Failure Representation and Entropy-Based Deep Clustering

Zhongxing Yu, Zhenyu Yang
article en

Abstract

Failure indexing aims to group multiple failures according to their root causes and is an essential step in parallel debugging. Failure indexing consists mainly of two steps: failure representation and failure clustering. While many research efforts have been devoted to these two steps, serious issues still exist. For failure representation, existing works use coverage or program memory information, which unfortunately can not capture deep failure semantic. For failure clustering, advanced failure indexing methods use clustering algorithms with preset cluster centers, but this kind of clustering algorithm can handle spherical clusters well but performs poorly when handling clusters of other shapes. To address these issues, this paper proposes GREClue, a novel failure indexing approach with Graph-based failure Representation and Entropy-based deep Clustering. GREClue overcomes the issues in order. For failure representation, GREClue designs the failure semantic graph (FSG), a new graph representation that effectively contains semantic information and runtime information of failures. Based on FSG, GREClue further consists of an entropy-based deep clustering component, which can accurately cluster failed tests without presetting cluster centers. An extensive evaluation of GREClue shows that compared to the state-of-the-art failure indexing method, GREClue improves both the performance of estimating the number of faults and the clustering effectiveness by 10% to 41%. Moreover, it has also been shown that GREClue can effectively facilitate parallel debugging.

Proceedings of the ACM on software engineering.Vol. 3(FSE)
Shandong University (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 5%
VLSI and Analog Circuit Testing
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