Investigation of Radiation Shielding Parameters of Tantalum Oxide Containing Bismuth Oxide Material

This study theoretically investigates the radiation shielding performance of epoxy-based composites containing different fractions of bismuth oxide and tantalum oxide as lead-free alternatives. Three composite samples were analyzed using Phy-X/PSD software for photon energies from 1 keV to 105 keV. Results Show that tantalum oxide significantly enhances shielding performance in the medium energy range (70-90 keV) due to tantalum’s K-absorption edge at ~67.4 keV, increasing photoelectric interaction probaility. Hybrid composites exhibit broader spectrum shielding compared to single-additive metarials. These epoxy, tantalum oxide and bismuth oxide composite present a promising alternative for portable radiation protection systems and medical imaging devices requiring lead-free shielding materials.