White-light-controlled resistive switching behavior in ZnO/NiO/Carbon heterostructures
In this paper, the resistive switching behavior controlled by the white-light irradiation was studied in ZnO/NiO/Carbon heterostructures. The current-voltage (I-V) hysteresis loops clearly demonstrate a pronounced bipolar resistance switching behavior in the heterostructures. The resistance switching effect can be modulated by light irradiation, which can be explained by the trap/detrap mechanism of charges. This study can help explore multi-functional materials and applications in feature nonvolatile memory devices.
Authors
- Junshuai Wang (ORCID: https://orcid.org/0000-0002-7601-7429)
- Qianfei Ma (ORCID: https://orcid.org/0000-0002-3451-4515)
- Junfan Chen
- Minghao Wang (ORCID: https://orcid.org/0009-0002-5713-1573)
- Jian Su
Institutions
- Twitter (United States) (US)
Publication Details
- Journal
- Functional Materials Letters
- Published
- 2026-06-30
- DOI
- https://doi.org/10.1142/s1793604726510276
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.00