Δ _T Noise as a Robust Diagnostic for Chiral, Helical and Trivial Edge Modes

Abstract In this article we demonstrate that Δ T noise provides a sensitive, practical probe for distinguishing chiral edge
modes from topological helical and trivial (non-topological) helical edge transport. Measured under zero-current
conditions, Δ T noise reveals contrasts that conventional conductance measurements typically miss. Crucially,
Δ T requires no external energy input in the form of an applied voltage bias, yet encodes the same intrinsic
information that shot noise yields in the zero-temperature, finite-bias limit, without the distorting effects of
Joule heating. This absence of bias-induced heating makes Δ T noise both more precise and more reliable than
conventional shot-noise approaches.