Power Semiconductor Module Busbar Welding Using a Single-Mode Fiber Laser (Part 1): Heat-Affected Zone Formation and Solidification Cracking Behavior during High-Speed Multi-Pass Welding

This study investigates the heat-affected zone (HAZ) formation behavior and solidification cracking characteristics in large-area Cu-Cu busbar joints fabricated by single-mode fiber laser multi-pass welding for power semiconductor module applications. The effects of welding condition and overlap ratio on weld integrity and mechanical performance were systematically evaluated. Under the conditions of heat input 3.5 and 4.5 J/mm, solidification cracking was effectively suppressed when the overlap ratio was controlled below 10 %, whereas higher overlap ratios resulted in severe solidification cracking. Under optimized multi-pass welding conditions, defect-free welds with HAZ-free characteristics were successfully achieved. The shear tensile strength of the multi-pass welds reached approximately 3.60 kN, corresponding to approximately a 920 % increase compared with that of the single-pass condition. Thermal history analysis using the Thermo-Calc Additive Manufacturing module revealed rapid heating and cooling behavior with an average cooling rate of approximately 7 × 10<sup>4</sup> K/s, which contributed to the suppression of heat accumulation and the prevention of HAZ formation during multi-pass welding. These results demonstrate that precise control of overlap ratio and heat input is essential for achieving reliable large-area Cu busbar joints in power semiconductor modules.

Authors

Institutions

Publication Details

Journal
Journal of Welding and Joining
Published
2026-06-30
DOI
https://doi.org/10.5781/jwj.2026.44.3.1
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Power Semiconductor Module Busbar Welding Using a Single-Mode Fiber Laser (Part 1): Heat-Affected Zone Formation and Solidification Cracking Behavior during High-Speed Multi-Pass Welding

Ye-Ji Yoo, Eun−Joon Chun, Keun-Jae Lee, Pil-Kyong Oh et al.
Journal of Welding and Joining
Silicon Carbide Semiconductor Technologies
article

Power Semiconductor Module Busbar Welding Using a Single-Mode Fiber Laser (Part 1): Heat-Affected Zone Formation and Solidification Cracking Behavior during High-Speed Multi-Pass Welding

Ye-Ji Yoo, Eun−Joon Chun, Keun-Jae Lee, Pil-Kyong Oh, Se-Min Park
article en

Abstract

This study investigates the heat-affected zone (HAZ) formation behavior and solidification cracking characteristics in large-area Cu-Cu busbar joints fabricated by single-mode fiber laser multi-pass welding for power semiconductor module applications. The effects of welding condition and overlap ratio on weld integrity and mechanical performance were systematically evaluated. Under the conditions of heat input 3.5 and 4.5 J/mm, solidification cracking was effectively suppressed when the overlap ratio was controlled below 10 %, whereas higher overlap ratios resulted in severe solidification cracking. Under optimized multi-pass welding conditions, defect-free welds with HAZ-free characteristics were successfully achieved. The shear tensile strength of the multi-pass welds reached approximately 3.60 kN, corresponding to approximately a 920 % increase compared with that of the single-pass condition. Thermal history analysis using the Thermo-Calc Additive Manufacturing module revealed rapid heating and cooling behavior with an average cooling rate of approximately 7 × 10<sup>4</sup> K/s, which contributed to the suppression of heat accumulation and the prevention of HAZ formation during multi-pass welding. These results demonstrate that precise control of overlap ratio and heat input is essential for achieving reliable large-area Cu busbar joints in power semiconductor modules.

Journal of Welding and JoiningVol. 44(3)
Hyundai Mobis (South Korea) (KR), Pukyong National University (KR)
Affordable and clean energy
Openalex Percentile: Top 12%
Silicon Carbide Semiconductor Technologies
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.