EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors

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Journal
Journal of Electronic Materials
Published
2026-06-29
DOI
https://doi.org/10.1007/s11664-026-12938-3
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
0.00

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article

EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors

Nicolas Péré‐Laperne, Philippe Christol, O. Gravrand, Axel Evirgen et al.
Journal of Electronic Materials
Advanced Semiconductor Detectors and Materials
article

EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors

Nicolas Péré‐Laperne, Philippe Christol, O. Gravrand, Axel Evirgen, C. Cervera, Nicolas Baier, Baptiste Gonon-Mathieu, Romuald Contie
article en

Abstract

No abstract available for this paper.
Journal of Electronic Materials
Centre National de la Recherche Scientifique (FR), Université de Montpellier (FR), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), CEA Grenoble (FR), Laboratoire d'Électronique des Technologies de l'Information (FR), III V Lab (FR), Université Grenoble Alpes (FR), Direction Générale de l'Armement (FR)
Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Direction Générale de l’Armement
Openalex Percentile: Top 11%
Advanced Semiconductor Detectors and Materials
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EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors — Nicolas Péré‐Laperne, Philippe Christol, et al. · Journal of Electronic Materials (2026) | TGRS Research Map | TGRS