Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Direction Générale de l’Armement
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article
EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors
Nicolas Péré‐Laperne, Philippe Christol, O. Gravrand, Axel Evirgen et al.
Journal
Journal of Electronic Materials
Topics
Advanced Semiconductor Detectors and Materials
article
EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors
Nicolas Péré‐Laperne, Philippe Christol, O. Gravrand, Axel Evirgen, C. Cervera, Nicolas Baier, Baptiste Gonon-Mathieu, Romuald Contie
article en
Abstract
No abstract available for this paper.
Publication Tag
Journal of Electronic Materials
Institutions
Centre National de la Recherche Scientifique (FR), Université de Montpellier (FR), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), CEA Grenoble (FR), Laboratoire d'Électronique des Technologies de l'Information (FR), III V Lab (FR), Université Grenoble Alpes (FR), Direction Générale de l'Armement (FR)
Funders
Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Direction Générale de l’Armement
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EBIC Characterization of Vertical Transport of Minority Carriers in Gallium-Free Type-II Superlattices for Infrared Detectors — Nicolas Péré‐Laperne, Philippe Christol, et al. · Journal of Electronic Materials (2026) | TGRS Research Map | TGRS