A Study on an ASRP Based Approach for Guided Missiles Considering Electronic Component Failure Characteristics

Purpose: This study develops a system-level storage reliability management framework that explicitly integrates electronic components into the Ammunition Stockpile Reliability Program (ASRP). While conventional ASRP primarily focuses on the chemical degradation of propellants and explosives, the increasing reliance of modern missile systems on electronics-which exhibit random failure characteristics-requires an enhanced approach to ensure long-term mission readiness.Methods: The proposed framework integrates design reliability data from the production phase with operational periodic inspection data. Failure rate trends are analyzed to classify electronic components by failure characteristics, enabling the development of tailored management strategies. Furthermore, the Martinez-type inspection interval model is applied to determine optimal system-level inspection intervals and related management parameters.Results: The framework facilitates the dynamic adjustment of management intensity by comparing design failure rates with operational data to identify significant performance deviations. By utilizing the Martinez-type model, the study evaluates whether existing inspection cycles satisfy target storage reliability requirements and derives optimized intervals to maintain system integrity.Conclusion: This study provides a practical, data-driven extension of the ASRP and a systematic methodology for the storage reliability management of advanced missile systems. The proposed framework overcomes the limitations of existing degradation-centric models that overlook the random failure characteristics of electronic components and their weak correlation with storage time.

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Publication Details

Journal
Journal of the Korean society for quality management
Published
2026-06-29
DOI
https://doi.org/10.7469/jksqm.2026.54.2.197
Primary Topic
Reliability and Maintenance Optimization
Type
article
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article

A Study on an ASRP Based Approach for Guided Missiles Considering Electronic Component Failure Characteristics

Y Kim, Soonwoo Park, Seong Don Hong, Da Hoon Lim et al.
Journal of the Korean society for quality management
Reliability and Maintenance Optimization
article

A Study on an ASRP Based Approach for Guided Missiles Considering Electronic Component Failure Characteristics

Y Kim, Soonwoo Park, Seong Don Hong, Da Hoon Lim, Yong Soo Kim, Kwanghui Shin, Yoojin Jang, JinSoo Jeong, Si-Woo Kim
article en

Abstract

Purpose: This study develops a system-level storage reliability management framework that explicitly integrates electronic components into the Ammunition Stockpile Reliability Program (ASRP). While conventional ASRP primarily focuses on the chemical degradation of propellants and explosives, the increasing reliance of modern missile systems on electronics-which exhibit random failure characteristics-requires an enhanced approach to ensure long-term mission readiness.Methods: The proposed framework integrates design reliability data from the production phase with operational periodic inspection data. Failure rate trends are analyzed to classify electronic components by failure characteristics, enabling the development of tailored management strategies. Furthermore, the Martinez-type inspection interval model is applied to determine optimal system-level inspection intervals and related management parameters.Results: The framework facilitates the dynamic adjustment of management intensity by comparing design failure rates with operational data to identify significant performance deviations. By utilizing the Martinez-type model, the study evaluates whether existing inspection cycles satisfy target storage reliability requirements and derives optimized intervals to maintain system integrity.Conclusion: This study provides a practical, data-driven extension of the ASRP and a systematic methodology for the storage reliability management of advanced missile systems. The proposed framework overcomes the limitations of existing degradation-centric models that overlook the random failure characteristics of electronic components and their weak correlation with storage time.

Journal of the Korean society for quality managementVol. 54(2)
Agency for Defense Development (KR), Kyonggi University (KR)
Openalex Percentile: Top 7%
Reliability and Maintenance Optimization
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