Tunnel field-effect transistors exhibiting performance beyond the Boltzmann thermionic limit

The International Roadmap for Devices and Systems (IRDS) has identified the tunnel field-effect transistor (TFET) as the most promising next-generation logic device that enables sustainable downscaling in driving voltage and power consumption. Demonstrating an acceptable sub–Boltzmann-limit ON current (namely I 60 , the current level when a TFET switches to a subthreshold swing level of 60 millivolts per decade) and current-switching ratio has presented a formidable challenge. We report a TFET based on a bismuth/indium selenide (Bi/InSe) heterostructure that exhibits an I 60 of up to ~10 microamperes per micrometer and a current-switching ratio of >10 7 . We attribute such promising TFETs to precise material design, clean interfaces fabricated under vacuum, and band engineering based on subthreshold swing physics. Our results demonstrate a high-performance basic building block that meets the IRDS requirements for next-generation integrated circuits.

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Publication Details

Journal
Science
Published
2026-08-27
DOI
https://doi.org/10.1126/science.adx6059
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
0.00

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article

Tunnel field-effect transistors exhibiting performance beyond the Boltzmann thermionic limit

Ran Ding, Songhua Cai, Yifei Zhao, Jianhua Hao et al.
Science
Advancements in Semiconductor Devices and Circuit Design
article

Tunnel field-effect transistors exhibiting performance beyond the Boltzmann thermionic limit

Ran Ding, Songhua Cai, Yifei Zhao, Jianhua Hao, Ke Yang, Fumei Yang, Lain‐Jong Li, Wanqing Meng, Ming Yang, Yee Sin Ang, Hui Li, Jiannong Wang, Zehan Wu, Weizhen Wang, Yudong Peng, Zongmeng Yang
article en

Abstract

The International Roadmap for Devices and Systems (IRDS) has identified the tunnel field-effect transistor (TFET) as the most promising next-generation logic device that enables sustainable downscaling in driving voltage and power consumption. Demonstrating an acceptable sub–Boltzmann-limit ON current (namely I 60 , the current level when a TFET switches to a subthreshold swing level of 60 millivolts per decade) and current-switching ratio has presented a formidable challenge. We report a TFET based on a bismuth/indium selenide (Bi/InSe) heterostructure that exhibits an I 60 of up to ~10 microamperes per micrometer and a current-switching ratio of >10 7 . We attribute such promising TFETs to precise material design, clean interfaces fabricated under vacuum, and band engineering based on subthreshold swing physics. Our results demonstrate a high-performance basic building block that meets the IRDS requirements for next-generation integrated circuits.

ScienceVol. 393(6814)
Hong Kong Polytechnic University (HK), Singapore University of Technology and Design (SG), National University of Singapore (SG), Singapore Institute of Technology (SG), Hong Kong University of Science and Technology (HK), Peking University (CN)
National Research Foundation Singapore, Hong Kong Polytechnic University
Industry, innovation and infrastructure
Openalex Percentile: Top 44%
Advancements in Semiconductor Devices and Circuit Design
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