Tender X-ray Coherence Characterization at Beamline BM44 of the High Energy Photon Source
High Resolution Image Download MS PowerPoint Slide A method for characterizing the spatial coherence of tender X-ray radiation using a single diffraction pattern is presented. The technique is based on scattering from a non-redundant array (NRA) of slits. It is used to measure the degree of spatial coherence at beamline BM44 (Tender X-ray Beamline) of the High Energy Photon Source. To verify the results, a Young’s double-slit experiment was also performed. This paper reports the coherence lengths obtained using both methods and provides a comparison and analysis of the two approaches. For the Tender X-ray Beamline, the measured vertical coherence length is 12.1±0.7μm using the NRA method, compared to 14.4±0.6μm derived from the Young’s double-slit experiment.
Authors
- Tianchong Zhang (ORCID: https://orcid.org/0000-0003-0337-609X)
- Shuhu Liu (ORCID: https://orcid.org/0000-0001-6374-0012)
- Y ZHAO (ORCID: https://orcid.org/0009-0009-4363-3207)
- Yongyang Wang (ORCID: https://orcid.org/0009-0006-0756-6543)
- X Zhao (ORCID: https://orcid.org/0000-0001-6672-4720)
- C W
- Lei Zheng (ORCID: https://orcid.org/0000-0002-6452-4124)
- Kun Tang (ORCID: https://orcid.org/0000-0001-5795-986X)
- Jianmin Li
- Dongmei Liu
Institutions
- Chinese Academy of Sciences (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Photon Science
- Published
- 2026-06-27
- DOI
- https://doi.org/10.1021/photonsci.6c00019
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00