Nanoscale frictional imaging of ferroelectric domains

Nanoscale control of electromechanical coupling transforms frictional information into a direct probe of ferroelectric polarization. Here, we show that an asymmetric friction response induced by high contact forces applied with a scanning probe microscopy tip enables spatially resolved visualization of ferroelectric polarization in thin films and single crystals. In agreement with multifield coupled continuum mechanical simulations, our results reveal that this friction asymmetry results from flexoelectrically induced polarization either competing with or enhancing the ferroelectric polarization, thus giving mechanical information on its orientation. This technique, which we term polarization-derived friction microscopy, allows rapid, low-cost, and voltage-free imaging of ferroelectric domains, thereby minimizing electrostatic measurement artifacts and achieving high scan rates beyond 14 frames per second. Our work opens broad opportunities for high-throughput functional imaging of surfaces with extensive potential applications such as voltage-free data acquisition and studies of polarization dynamics in complex environments.

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Publication Details

Journal
Science Advances
Published
2026-06-26
DOI
https://doi.org/10.1126/sciadv.aee0247
Primary Topic
Piezoelectric Actuators and Control
Type
article
Field-Weighted Citation Impact
0.00

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article

Nanoscale frictional imaging of ferroelectric domains

Céline Lichtensteiger, Eunnuri Cho, Seungbum Hong, Iaroslav Gaponenko et al.
Science Advances
Piezoelectric Actuators and Control
article

Nanoscale frictional imaging of ferroelectric domains

Céline Lichtensteiger, Eunnuri Cho, Seungbum Hong, Iaroslav Gaponenko, Dennis Meier, Patrycja Paruch, Jan Schultheiß, S.E. Ryu, Ruben S. Dragland, Ji Hye Lee, Seongwoo Cho, Hyeonbin Moon
article en

Abstract

Nanoscale control of electromechanical coupling transforms frictional information into a direct probe of ferroelectric polarization. Here, we show that an asymmetric friction response induced by high contact forces applied with a scanning probe microscopy tip enables spatially resolved visualization of ferroelectric polarization in thin films and single crystals. In agreement with multifield coupled continuum mechanical simulations, our results reveal that this friction asymmetry results from flexoelectrically induced polarization either competing with or enhancing the ferroelectric polarization, thus giving mechanical information on its orientation. This technique, which we term polarization-derived friction microscopy, allows rapid, low-cost, and voltage-free imaging of ferroelectric domains, thereby minimizing electrostatic measurement artifacts and achieving high scan rates beyond 14 frames per second. Our work opens broad opportunities for high-throughput functional imaging of surfaces with extensive potential applications such as voltage-free data acquisition and studies of polarization dynamics in complex environments.

Science AdvancesVol. 12(26)
University of Geneva (CH), Georgia Institute of Technology (US), Seoul National University (KR), Korea Advanced Institute of Science and Technology (KR), Norwegian University of Science and Technology (NO), Advanced Institute of Convergence Technology (KR), University of Duisburg-Essen (DE), Ruhr University Bochum (DE)
National Science Foundation, National Research Foundation, Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung, National Research Foundation of Korea, Ministry of Science and ICT, South Korea, Horizon 2020 Framework Programme
Openalex Percentile: Top 7%
Piezoelectric Actuators and Control
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