Probing Nanosecond-to-Microsecond Structural Dynamics by Ultrafast Transmission Electron Microscopy with Optical and Electrical Excitation
Time-resolved visualization of local structural dynamics driven by external fields is essential for understanding structure–property relationships in functional materials and devices. Conventional ultrafast methods primarily capture femtosecond-to-picosecond photoinduced dynamics, yet they lack real-space access to spatially inhomogeneous processes occurring at their intrinsic mesoscopic timescales that govern material and device performance—particularly electrically driven processes that closely mimic actual device operating conditions. Here, we report a multifunctional ultrafast transmission electron microscopy (UTEM) platform targeting reversible structural dynamics spanning nanoseconds to microseconds under stroboscopic multi-field excitation. Our system employs photoelectron pulses generated by nanosecond UV laser illumination as the probe, alongside optical and electric pulses as pump excitation. A unified electronic synchronization scheme based on a high-speed photodiode and a digital delay generator enables precise timing control among the optical pump, electrical pump, and photoelectron pulses across the nanosecond-to-microsecond range. Using vanadium dioxide (VO2) as a model system, we demonstrate a combined spatiotemporal resolution with measurable signals on the order of 10 nm–10 ns, allowing real-space mapping of spatially inhomogeneous dynamics. Electrical-pump experiments further reveal Joule-heating-induced non-uniform structural phase transitions and thermal-shock-excited megahertz-range mechanical oscillations. These results establish the developed multi-field UTEM platform as a practical tool for probing local structural dynamics in functional materials under optical and electrical excitation.
Authors
- X J Wang
- S. S. Sun (ORCID: https://orcid.org/0000-0002-9363-3901)
- Siyuan Huang (ORCID: https://orcid.org/0000-0003-0465-0468)
- Li J (ORCID: https://orcid.org/0000-0002-6679-5227)
- Jianqi Li (ORCID: https://orcid.org/0000-0002-4808-6347)
- Huaixin Yang
- Yanqing Tong
- Huanfang Tian
Institutions
- Chinese Academy of Sciences (CN)
- Songshan Lake Materials Laboratory (CN)
- Institute of Physics (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Photonics
- Published
- 2026-06-25
- DOI
- https://doi.org/10.3390/photonics13070610
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences
- National Key Research and Development Program of China