Measurement and study of the jitter measurement floor of a broadband sampling oscilloscope

The jitter measurement floor of a broadband sampling oscilloscope represents an effective lower bound for time-domain jitter measurements and can limit the accuracy of low-jitter characterization. Because characterization procedures can be complex and the results are affected by multiple coupled test conditions, this paper develops a systematic time-domain framework for characterizing the jitter measurement floor. A reproducible measurement setup based on a low-jitter signal source is established, and the effects of vertical sensitivity, input frequency, and input amplitude on the jitter measurement floor are quantitatively evaluated. Based on these results, a rapid parameter-sweep and screening procedure is presented to quickly determine the parameter setting range associated with a near-minimum jitter measurement floor. To reduce reliance on ultra-low-jitter reference sources, simulations and experiments are conducted to examine the relationship among the measured jitter, the source jitter, and the jitter measurement floor of the oscilloscope; the results are consistent with a root-mean-square combination model. Leveraging this model, a root-mean-square-based method is introduced to extract the jitter measurement floor, which remains applicable when an ultra-low-jitter source is unavailable. Experimental results support the effectiveness and practical feasibility of the proposed workflow, suggesting an accessible route toward reproducible time-domain characterization of the jitter measurement floor of sampling oscilloscopes.

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Publication Details

Journal
Measurement and Control
Published
2026-06-18
DOI
https://doi.org/10.1177/00202940261462298
Primary Topic
Microwave and Dielectric Measurement Techniques
Type
article
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article

Measurement and study of the jitter measurement floor of a broadband sampling oscilloscope

Yifan Wang, Weibin Xie, Kejia Zhao, Jiangmiao Zhu et al.
Measurement and Control
Microwave and Dielectric Measurement Techniques
article

Measurement and study of the jitter measurement floor of a broadband sampling oscilloscope

Yifan Wang, Weibin Xie, Kejia Zhao, Jiangmiao Zhu, Chaoxian Fu, Yufen Sun
article en

Abstract

The jitter measurement floor of a broadband sampling oscilloscope represents an effective lower bound for time-domain jitter measurements and can limit the accuracy of low-jitter characterization. Because characterization procedures can be complex and the results are affected by multiple coupled test conditions, this paper develops a systematic time-domain framework for characterizing the jitter measurement floor. A reproducible measurement setup based on a low-jitter signal source is established, and the effects of vertical sensitivity, input frequency, and input amplitude on the jitter measurement floor are quantitatively evaluated. Based on these results, a rapid parameter-sweep and screening procedure is presented to quickly determine the parameter setting range associated with a near-minimum jitter measurement floor. To reduce reliance on ultra-low-jitter reference sources, simulations and experiments are conducted to examine the relationship among the measured jitter, the source jitter, and the jitter measurement floor of the oscilloscope; the results are consistent with a root-mean-square combination model. Leveraging this model, a root-mean-square-based method is introduced to extract the jitter measurement floor, which remains applicable when an ultra-low-jitter source is unavailable. Experimental results support the effectiveness and practical feasibility of the proposed workflow, suggesting an accessible route toward reproducible time-domain characterization of the jitter measurement floor of sampling oscilloscopes.

Measurement and Control
Beijing University of Technology (CN)
Openalex Percentile: Top 10%
Microwave and Dielectric Measurement Techniques
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Measurement and study of the jitter measurement floor of a broadband sampling oscilloscope — Yifan Wang, Weibin Xie, et al. · Measurement and Control (2026) | TGRS Research Map | TGRS