A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions

Ion energy dependence of track radius in Si was investigated under C 60 ion irradiation between 30 keV and 9 MeV. The tracks were observed from 9 MeV down to 60 keV but not at 30 keV. The track radius gradually decreased with decreasing the energy from 9 MeV to 500 keV, showing a tentative increase around 300 keV followed by further decrease. Both (i) the track formation at exceptionally low energies and (ii) the non-monotonic energy dependence of the track radius, are explained by the ion energy dependence of electronic and nuclear energy losses of C 60 ions in Si, i.e., the cluster-ion energy loss (CIEL) model.

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Publication Details

Journal
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Published
2026-06-17
DOI
https://doi.org/10.1016/j.nimb.2026.166225
Primary Topic
Ion-surface interactions and analysis
Type
article
Field-Weighted Citation Impact
0.00

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article

A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions

K. Yamada, H. Amekura, Kazumasa Narumi, S. Yamamoto et al.
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Ion-surface interactions and analysis
article

A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions

K. Yamada, H. Amekura, Kazumasa Narumi, S. Yamamoto, A. Chiba, Y. Hirano, H. Segawa, Y. Saitoh
article en

Abstract

Ion energy dependence of track radius in Si was investigated under C 60 ion irradiation between 30 keV and 9 MeV. The tracks were observed from 9 MeV down to 60 keV but not at 30 keV. The track radius gradually decreased with decreasing the energy from 9 MeV to 500 keV, showing a tentative increase around 300 keV followed by further decrease. Both (i) the track formation at exceptionally low energies and (ii) the non-monotonic energy dependence of the track radius, are explained by the ion energy dependence of electronic and nuclear energy losses of C 60 ions in Si, i.e., the cluster-ion energy loss (CIEL) model.

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsVol. 579
National Institute for Materials Science (JP), National Institutes for Quantum Science and Technology (JP)
Japan Society for the Promotion of Science
Affordable and clean energy
Openalex Percentile: Top 8%
Ion-surface interactions and analysis
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