A general data-driven framework for scalable electron tomography
Abstract Electron tomography (ET) is crucial for determining the three-dimensional (3D) structure of materials in real space but challenging due to the inherent missing-wedge, intensive-dose, and limited depth-of-field. Although deep learning can address these challenges in principle, the scarcity of ET data severely limits its application. In this study, we propose a general data-driven ET reconstruction framework that uses extensive and readily available random high-entropy projections to construct large-scale datasets. By integrating both real structural priors and depth-dependent imaging physics, the framework enables high-quality 3D reconstruction independent of specific materials or resolutions. Using this strategy, we successfully determine the 3D atomic structure of a 13-nm Pt nanoparticle containing 52 138 atoms, achieving a root-mean-square displacement of 22.6 pm; and the projection consistency error is significantly reduced, effectively expanding the depth-of-field limit of atomic-scale ET.
Authors
- Lu Gan (ORCID: https://orcid.org/0000-0002-8785-867X)
- Z L Chen
- Huan Lei (ORCID: https://orcid.org/0000-0002-9730-6481)
- Kuang Yu (ORCID: https://orcid.org/0000-0001-9142-5263)
- Wei Yinpin
- Li J (ORCID: https://orcid.org/0000-0002-6679-5227)
- Jie Yang (ORCID: https://orcid.org/0000-0003-4801-7162)
- Han Li (ORCID: https://orcid.org/0000-0002-7380-6174)
- Wenting Cui
- Xuan Luo
Institutions
- Tsinghua University (CN)
Publication Details
- Journal
- National Science Review
- Published
- 2026-06-16
- DOI
- https://doi.org/10.1093/nsr/nwag365
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00