Generative-model-based null-space iterative reconstruction for atomic electron tomography with sparse data
Atomic electron tomography (AET) is a powerful technique for determining the three-dimensional atomic structure of matter in real space. However, conventional AET requires numerous projections across a wide angular range. The high dose and prolonged acquisition severely limit its application. Here, we propose an interpretable and universal algorithm for low-dose, fast and tilt-constrained AET: null-space iterative reconstruction (NSIRE), which uses an unsupervised diffusion model to iteratively compute null-space solutions of projection equations, thereby generating tomograms consistent with both projection constraints and atomic potential prior. NSIRE can resolve a wide range of complex materials under 6–12° sparse projection or within ±29° small tilt-range without retraining. Using the NSIRE, we determine the three-dimensional atomic structures of a 4-nm Pt nanoparticle with grain boundaries and a 3-nm PtCo nanoalloy (the smallest one resolved so far), achieving a root-mean-square displacement of <20 pm and high projection consistency, overcoming the scale, dose and time limitations of AET. The authors present NSIRE, a generative-AI-based algorithm that reconstructs 3D atomic structures from sparse data, enabling low-dose, fast, and tilt-constrained atomic electron tomography while preserving high accuracy across complex materials.
Authors
- Kuang Yu (ORCID: https://orcid.org/0000-0001-9142-5263)
- Lin Gan (ORCID: https://orcid.org/0000-0003-3486-6016)
- Jia Li (ORCID: https://orcid.org/0000-0001-9361-2281)
- Wenting Cui (ORCID: https://orcid.org/0000-0001-9870-0897)
- Jiali Yang (ORCID: https://orcid.org/0000-0002-6402-6168)
- Wenda Su
- Huan Lei
- Han Li (ORCID: https://orcid.org/0009-0005-7200-5323)
Institutions
- Tsinghua–Berkeley Shenzhen Institute (CN)
Publication Details
- Journal
- Nature Communications
- Published
- 2026-06-16
- DOI
- https://doi.org/10.1038/s41467-026-74189-4
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Division of Materials Research