Crack-Free Precision during Desiccation: Optimizing Aerosol Jet Printing for High-Performance Conductive Microstructure Manufacturing

Aerosol jet printing (AJP) is a high-resolution additive manufacturing technique that enables the deposition of conductive materials onto diverse substrates. However, a significant challenge in AJP is the occurrence of cracking in printed lines, which undermines both electrical conductivity and structural integrity. Herein, we examine the desiccation-induced cracking mechanism in AJP and introduce optimization strategies to mitigate cracking and enhance the conductivity of printed silver lines. Through a detailed analysis of crack morphology and distribution, key factors such as the deposition thickness and overspray regions are identified. The proposed optimizations, comprising regulation of the deposition thickness, enhancement of resolution, and minimization of overspray, yielded crack-free, high-quality silver lines with superior conductivity. These findings offer crucial insights for the advancement of reliable conductive structures in conformal electronics and microelectronics applications.

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Publication Details

Journal
Nano Letters
Published
2026-06-08
DOI
https://doi.org/10.1021/acs.nanolett.6c01881
Primary Topic
Nanomaterials and Printing Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Crack-Free Precision during Desiccation: Optimizing Aerosol Jet Printing for High-Performance Conductive Microstructure Manufacturing

Malik Dilshad Khan, Jordi Arbiol, Karol Viviana Mejía‐Centeno, Jing Yu et al.
Nano Letters
Nanomaterials and Printing Technologies
article

Crack-Free Precision during Desiccation: Optimizing Aerosol Jet Printing for High-Performance Conductive Microstructure Manufacturing

Malik Dilshad Khan, Jordi Arbiol, Karol Viviana Mejía‐Centeno, Jing Yu, Qing Sun, Andreu Cabot, Geng Li, Shang Wang, Yuxin Sun, Yanhong Tian
article en

Abstract

Aerosol jet printing (AJP) is a high-resolution additive manufacturing technique that enables the deposition of conductive materials onto diverse substrates. However, a significant challenge in AJP is the occurrence of cracking in printed lines, which undermines both electrical conductivity and structural integrity. Herein, we examine the desiccation-induced cracking mechanism in AJP and introduce optimization strategies to mitigate cracking and enhance the conductivity of printed silver lines. Through a detailed analysis of crack morphology and distribution, key factors such as the deposition thickness and overspray regions are identified. The proposed optimizations, comprising regulation of the deposition thickness, enhancement of resolution, and minimization of overspray, yielded crack-free, high-quality silver lines with superior conductivity. These findings offer crucial insights for the advancement of reliable conductive structures in conformal electronics and microelectronics applications.

Nano Letters
Institució Catalana de Recerca i Estudis Avançats (ES), Harbin Institute of Technology (CN), Faculty (United Kingdom) (GB), Institut Català de Nanociència i Nanotecnologia (ES), Institut de Recerca en Energia de Catalunya (ES), Welding Science (Brazil) (BR), Universitat de Barcelona (ES)
Ministerio de Ciencia, Innovación y Universidades, European Regional Development Fund, National Key Research and Development Program of China, HORIZON EUROPE Marie Sklodowska-Curie Actions
Openalex Percentile: Top 10%
Nanomaterials and Printing Technologies
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