Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode
Resonant-tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 μm and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 μm.
Authors
- Koji Terumoto
- Yuta Inose (ORCID: https://orcid.org/0000-0001-6950-2293)
- Yousuke Nishida
- Toshihisa Maeda
- Shota Ito
- Masayuki Fujita (ORCID: https://orcid.org/0000-0003-1772-0891)
- Li Yi (ORCID: https://orcid.org/0000-0003-0216-831X)
- Chao Tang (ORCID: https://orcid.org/0000-0002-6788-9575)
Institutions
- Toyo University (JP)
- ROHM (JP)
- Tohoku University (JP)
- Osaka Prefectural Toyonaka Support School (JP)
- Ibaraki University (JP)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2026-05-28
- DOI
- https://doi.org/10.1063/5.0331663
- Primary Topic
- Terahertz technology and applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00