Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode

Resonant-tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 μm and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 μm.

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Publication Details

Journal
Journal of Applied Physics
Published
2026-05-28
DOI
https://doi.org/10.1063/5.0331663
Primary Topic
Terahertz technology and applications
Type
article
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article

Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode

Koji Terumoto, Yuta Inose, Yousuke Nishida, Toshihisa Maeda et al.
Journal of Applied Physics
Terahertz technology and applications
article

Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode

Koji Terumoto, Yuta Inose, Yousuke Nishida, Toshihisa Maeda, Shota Ito, Masayuki Fujita, Li Yi, Chao Tang
article en

Abstract

Resonant-tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 μm and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 μm.

Journal of Applied PhysicsVol. 139(20)
Toyo University (JP), ROHM (JP), Tohoku University (JP), Osaka Prefectural Toyonaka Support School (JP), Ibaraki University (JP)
Affordable and clean energy
Openalex Percentile: Top 8%
Terahertz technology and applications
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