Benchmarking Focus Metrics for Microparticle Localization in In-Line Digital Holography

Accurate axial localization of microparticles is a key requirement in in-line digital holography (ILDH), particularly under noisy conditions and for weakly scattered objects. This work presents experimental and simulated benchmarking of three widely used focus metrics: maximum intensity, complex amplitude, and Kurtosis. Experimental holograms of microparticles with different diameters were recorded using a compact ILDH system, while simulated holograms of a 10 µm particle were generated. Numerical reconstruction was performed using a Fresnel convolution approach with FFT-based propagation over a range of axial distances. The performance of each focus metric was evaluated based on peak definition, robustness to coherent noise, and consistency across particle sizes and configurations. The results show that both maximum intensity and Kurtosis provide consistent and reliable axial localization, with very similar behavior across all cases. In contrast, the complex amplitude metric is more sensitive to noise and exhibits larger fluctuations in the axial response. These results indicate that simple intensity-based metrics can achieve accurate localization under moderate signal-to-noise conditions, while higher-order statistical metrics improve robustness in more challenging scenarios. This work provides practical guidelines for selecting autofocus criteria in ILDH systems for particle imaging and holographic metrology.