Dynamic Compensation Implementation for High-Frequency Electrosurgical Unit Testing Using High-Frequency LCR or Network Analyzers Above MHz

This technical document presents a dynamic compensation method for high-frequency electrosurgical unit (ESU) testing using high-frequency LCR meters or network analyzers. The method addresses measurement errors caused by parasitic capacitance and inductance in resistive components above 1 MHz. By using real-time impedance measurement, dynamic modeling, and adaptive compensation algorithms, the proposed approach improves ESU testing accuracy. Experimental results show that within the 1 MHz to 5 MHz range, impedance error is reduced from 14.8% to 1.8%, while phase error is reduced from 9.8 degrees to 0.8 degrees.