Knowledge distillation and pseudo-labeling for lightweight YOLOv11-based structural crack detection
Structural cracks threaten the safety and long-term durability of civil infrastructure, yet manual inspection remains slow, subjective, and unreliable on complex surfaces. This study presents a training-centric strategy to improve a lightweight YOLOv11-N detector (2.6 M parameters) by transferring knowledge from a high-capacity YOLOv11-L teacher, without modifying the student architecture. Two semi-supervised mechanisms are investigated: pseudo-labeling and knowledge distillation. Using a crack dataset enlarged via systematic data augmentation, pseudo-labeling combines high-confidence teacher predictions with available ground-truth annotations through IoU and NMS filtering, while the distillation approach guides the student using both hard labels and teacher-derived soft signals to strengthen localization behavior. Experimental results show that both strategies enhance the baseline student model, with pseudo-labeling providing more stable training dynamics and stronger overall gains, whereas distillation primarily improves convergence behavior and sample efficiency. Ablation analyses highlight that the benefit of pseudo-labeling is data-dependent and requires a minimum pseudo-label density to achieve consistent improvements. Finally, edge-device (Raspberry 3B + and Nvidia Jetson Nano Kit) benchmarks validate that the resulting lightweight detector is suitable for deployment on resource-constrained platforms, enabling practical UAV- and mobile-oriented crack inspection across diverse edge computing tiers.
Authors
- Burak AĞGÜL (ORCID: https://orcid.org/0000-0002-9183-1568)
- Kaan ARIK (ORCID: https://orcid.org/0000-0002-0930-8955)
Institutions
- Sakarya University (TR)
- Istanbul Topkapi University (TR)
Publication Details
- Journal
- Scientific Reports
- Published
- 2026-05-23
- DOI
- https://doi.org/10.1038/s41598-026-52396-9
- Primary Topic
- Infrastructure Maintenance and Monitoring
- Type
- article
- Field-Weighted Citation Impact
- 0.00