Alignment strategies for white-light interference microscopes in the visible and UV ranges
• A complete alignment protocol is presented for two broadband Linnik interferometers. • Optical components and alignment method well-adapted for interferometric measurements in the UV-visible-near IR (300–1100 nm). • Alignment minimizes chromatic aberrations and compensates for optical losses. • Successful implementation enables high-resolution topographic and spectroscopic imaging. • Provides a robust experimental basis for future nanoscale material characterization.
Authors
- Sébastien Marbach (ORCID: https://orcid.org/0000-0003-0971-3966)
- Rémy Claveau (ORCID: https://orcid.org/0000-0002-2187-2233)
- Jesse Schiffler (ORCID: https://orcid.org/0000-0002-9758-3489)
- Olivier Félix (ORCID: https://orcid.org/0000-0001-9749-7970)
- Farid Mahfoud
- Matthias Pauly (ORCID: https://orcid.org/0000-0002-7492-0710)
- Paul Montgomery
- Manuel Flury (ORCID: https://orcid.org/0000-0002-1878-884X)
Institutions
- École Normale Supérieure de Lyon (FR)
- Centre National de la Recherche Scientifique (FR)
- Institut Charles Sadron (FR)
- Université de Lyon (FR)
- Laboratoire de Physique de l'ENS de Lyon (FR)
- Université de Strasbourg (FR)
Publication Details
- Journal
- Optics and Lasers in Engineering
- Published
- 2026-05-22
- DOI
- https://doi.org/10.1016/j.optlaseng.2026.109872
- Primary Topic
- Near-Field Optical Microscopy
- Type
- article
- Field-Weighted Citation Impact
- 0.00