Multi-Target Radar Speed Meter Failure Mechanism Research

Multi-target radar speed measuring instruments play a crucial role in monitoring speeding violations of multiple targets in multiple lanes, ensuring the safety, order, and efficient operation of traffic. In order to verify the stability of these instruments under long-term and complex working conditions, accelerated life testing was conducted, and the failure mechanisms of the radar were studied using optical and scanning electron microscopic analysis methods. The results indicated that at a test temperature of 85 °C and humidity of 79% RH, all five speed measuring specimens failed after testing for 55 days. The primary cause of failure was the malfunction of the microwave signal receiving chip in the radar speed module under the combination of temperature and humidity. The failure modes of the chip were mainly related to its structure, design, selection of soldering materials, and soldering process. This study provides references and insights for the reliability research of other metrological instrument products.

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Publication Details

Journal
Sensors
Published
2026-05-19
DOI
https://doi.org/10.3390/s26103209
Primary Topic
Microwave and Dielectric Measurement Techniques
Type
article
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Multi-Target Radar Speed Meter Failure Mechanism Research

Sensors
Microwave and Dielectric Measurement Techniques
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Multi-Target Radar Speed Meter Failure Mechanism Research

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Abstract

Multi-target radar speed measuring instruments play a crucial role in monitoring speeding violations of multiple targets in multiple lanes, ensuring the safety, order, and efficient operation of traffic. In order to verify the stability of these instruments under long-term and complex working conditions, accelerated life testing was conducted, and the failure mechanisms of the radar were studied using optical and scanning electron microscopic analysis methods. The results indicated that at a test temperature of 85 °C and humidity of 79% RH, all five speed measuring specimens failed after testing for 55 days. The primary cause of failure was the malfunction of the microwave signal receiving chip in the radar speed module under the combination of temperature and humidity. The failure modes of the chip were mainly related to its structure, design, selection of soldering materials, and soldering process. This study provides references and insights for the reliability research of other metrological instrument products.

SensorsVol. 26(10)
Nanjing Tech University (CN), Zhejiang Lab (CN), Zhejiang University of Technology (CN)
Responsible consumption and production
Openalex Percentile: Top 8%
Microwave and Dielectric Measurement Techniques
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