High-performance RT-DETR model for industrial defect detection with semantic guidance and hierarchical attention
With the advancement of intelligent manufacturing and Industry 4.0, surface defect detection plays a critical role in ensuring product quality and production safety. To address the limitations of existing detection models in handling small sample sizes, complex textures, and multi-scale defects, this paper proposes a high-performance industrial defect detection model based on the RT-DETR framework, incorporating semantic guidance and hierarchical attention mechanisms. Specifically, a Semantic-Guided Query Enhancement Module is designed to strengthen the contextual awareness of query vectors through multi-source semantic paths and a residual feedback structure. Additionally, a Hierarchical Attention Fusion Structure is constructed to build interactive graphs among multi-scale features, achieving cross-scale semantic alignment and structural consistency modeling. Experiments conducted on three benchmark industrial defect datasets-NEU-DET, DAGM2007, and PCB-DET-demonstrate the effectiveness of the proposed method, achieving [email protected] scores of 78.9%, 84.7%, and 87.4%, respectively, outperforming the best baseline models by 1.2% to 3.0%. For the more stringent [email protected]:0.95 metric, the method achieves 44.3%, 48.1%, and 52.3%, significantly surpassing mainstream models such as YOLOv8, and BMA-YOLO. Furthermore, Grad-CAM visualizations validate the model's superior focus capability and boundary-fitting accuracy in regions with complex textures and sparse targets. Overall, the proposed architecture enhances semantic perception, scale robustness, and generalization performance in industrial defect detection while maintaining real-time efficiency.
Authors
- Yunlong Tang (ORCID: https://orcid.org/0000-0002-9711-3380)
- Jiayu Ye (ORCID: https://orcid.org/0000-0003-0368-9651)
- Taihua Zhang (ORCID: https://orcid.org/0000-0002-3594-3733)
- Jingwen Xu
- Puxuan Li
- Bingyue Xu
- Bin Gu
- Jin Huang (ORCID: https://orcid.org/0000-0002-9967-3357)
Institutions
- Zhejiang Industry Polytechnic College (CN)
Publication Details
- Journal
- PLoS ONE
- Published
- 2026-05-12
- DOI
- https://doi.org/10.1371/journal.pone.0348807
- Primary Topic
- Advanced Neural Network Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00