Design and Characterization of a Prototype Pixel Readout Chip for Synchrotron Single Photon-Counting Detectors with 50 µm Pitch and 20 e-rms ENC Noise

As synchrotron radiation sources (SRSs) expand to cover a broader energy range, the demand for hybrid detectors with improved spatial and energy resolution is increasing. This paper presents the design and characterization of a prototype pixel readout ASIC featuring a small pixel size and low noise, developed for low energy soft X-ray applications. This chip adopts the single photon-counting (SPC) approach and each pixel consists of a front-end amplifier, a discriminator, a charge injection circuitry and a pair of 15-bit counters with associated logic. Fabricated in a 130 nm CMOS process, the chip integrates a 2 × 16 pixel matrix with a 50 µm ×50 µm pixel size. Measurement results indicate the maximum pixel equivalent noise charge (ENC) across the matrix is 20 e−rms without sensor attached. The results validate that the chip design has the potential to deliver a low-energy resolution for soft X-ray applications.

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Journal
Sensors
Published
2026-05-09
DOI
https://doi.org/10.3390/s26102992
Primary Topic
Particle Detector Development and Performance
Type
article
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article

Design and Characterization of a Prototype Pixel Readout Chip for Synchrotron Single Photon-Counting Detectors with 50 µm Pitch and 20 e-rms ENC Noise

Fuwan Gan, 盛振, T R Sun, Shijie Lu et al.
Sensors
Particle Detector Development and Performance
article

Design and Characterization of a Prototype Pixel Readout Chip for Synchrotron Single Photon-Counting Detectors with 50 µm Pitch and 20 e-rms ENC Noise

Fuwan Gan, 盛振, T R Sun, Shijie Lu, Tianyang Wang, Yifan Jiang
article en

Abstract

As synchrotron radiation sources (SRSs) expand to cover a broader energy range, the demand for hybrid detectors with improved spatial and energy resolution is increasing. This paper presents the design and characterization of a prototype pixel readout ASIC featuring a small pixel size and low noise, developed for low energy soft X-ray applications. This chip adopts the single photon-counting (SPC) approach and each pixel consists of a front-end amplifier, a discriminator, a charge injection circuitry and a pair of 15-bit counters with associated logic. Fabricated in a 130 nm CMOS process, the chip integrates a 2 × 16 pixel matrix with a 50 µm ×50 µm pixel size. Measurement results indicate the maximum pixel equivalent noise charge (ENC) across the matrix is 20 e−rms without sensor attached. The results validate that the chip design has the potential to deliver a low-energy resolution for soft X-ray applications.

SensorsVol. 26(10)
Chinese Academy of Sciences (CN), ShanghaiTech University (CN), Shanghai Zhangjiang Laboratory (CN), Shanghai Institute of Microsystem and Information Technology (CN), University of Chinese Academy of Sciences (CN)
Reduced inequalities
Openalex Percentile: Top 5%
Particle Detector Development and Performance
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