Analysis of crosstalk mechanisms in SiC MOSFET drive circuits and suppression strategies for offshore wind converters

With the development of new energy power systems and high-frequency power electronics technology, SiC MOSFETs have become ideal alternatives to traditional silicon-based devices due to their advantages of high switching frequency and low loss. However, crosstalk in driver circuits under high-frequency operating conditions severely restricts their reliability. This paper conducts a systematic study on the crosstalk mechanism of SiC MOSFET driver circuits, adopting multi-dimensional crosstalk suppression strategies through theoretical modelling, PCB layout optimization, and experimental verification. A dual-pulse test platform controlled by FPGA is built to verify the stability and reliability of the optimized driver circuit under a hig h bus voltage condition. This research provides a low-parasitic-parameter and high-reliability driver design scheme for SiC MOSFETs in high-frequency application scenarios such as new energy vehicles and photovoltaic inverters, which is of important reference value for promoting the engineering application of wide-bandgap semiconductor devices.

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Publication Details

Journal
IET conference proceedings.
Published
2026-05-01
DOI
https://doi.org/10.1049/icp.2026.0688
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
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article

Analysis of crosstalk mechanisms in SiC MOSFET drive circuits and suppression strategies for offshore wind converters

Jiachuan You, Zou Kaikai, Yanxia Yao, Yi Lu et al.
IET conference proceedings.
Silicon Carbide Semiconductor Technologies
article

Analysis of crosstalk mechanisms in SiC MOSFET drive circuits and suppression strategies for offshore wind converters

Jiachuan You, Zou Kaikai, Yanxia Yao, Yi Lu, Haiying Li, Lu Yu, Mingzi Li
article en

Abstract

With the development of new energy power systems and high-frequency power electronics technology, SiC MOSFETs have become ideal alternatives to traditional silicon-based devices due to their advantages of high switching frequency and low loss. However, crosstalk in driver circuits under high-frequency operating conditions severely restricts their reliability. This paper conducts a systematic study on the crosstalk mechanism of SiC MOSFET driver circuits, adopting multi-dimensional crosstalk suppression strategies through theoretical modelling, PCB layout optimization, and experimental verification. A dual-pulse test platform controlled by FPGA is built to verify the stability and reliability of the optimized driver circuit under a hig h bus voltage condition. This research provides a low-parasitic-parameter and high-reliability driver design scheme for SiC MOSFETs in high-frequency application scenarios such as new energy vehicles and photovoltaic inverters, which is of important reference value for promoting the engineering application of wide-bandgap semiconductor devices.

IET conference proceedings.Vol. 2025(49)
State Grid Corporation of China (China) (CN), China Electric Equipment Group (China) (CN), Shanghai Electric (China) (CN)
Affordable and clean energy
Openalex Percentile: Top 10%
Silicon Carbide Semiconductor Technologies
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