Uncertainty analysis of microsphere circumference diameter measurement based on Whispering-Gallery-Mode resonance

Microspheres are widely used as reference artefacts in microscale three-dimensional metrology, yet accurate diameter measurement remains challenging. This study presents a method for evaluating the circumferential diameter of microspheres based on whispering-gallery-mode (WGM) resonance, in which the sphere itself functions as an optical resonator and its effective resonator length is derived from measured resonance wavelengths. Resonant wavelengths are measured with sub-picometer resolution using evanescent coupling via a micro-optical fiber, and the associated angular, azimuthal, and radial mode numbers are uniquely identified through near-field observation of the surface electric field intensity distribution. A Monte Carlo–based uncertainty analysis is performed to quantify the contributions of resonance wavelength measurement, refractive index variation, and mode identification. Experimental results demonstrate nanometer-scale consistency among independently evaluated modes, and the expanded uncertainty of the circumferential diameter measurement is on the order of several 10 nm. The proposed method provides a reliable and high-precision approach for microsphere diameter evaluation, suitable for dimensional metrology and calibration applications. • A circumferential diameter measurement method for microspheres based on whispering-gallery-mode resonance is proposed. • Angular, azimuthal, and radial mode numbers are uniquely identified via near-field electric field observation. • Monte Carlo–based uncertainty analysis quantitatively evaluates wavelength, refractive index, and mode identification effects. • Nanometer-scale consistency and expanded uncertainty of several tens of nanometers are demonstrated.

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Publication Details

Journal
Precision Engineering
Published
2026-05-01
DOI
https://doi.org/10.1016/j.precisioneng.2026.04.017
Primary Topic
Near-Field Optical Microscopy
Type
article
Field-Weighted Citation Impact
0.00

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article

Uncertainty analysis of microsphere circumference diameter measurement based on Whispering-Gallery-Mode resonance

Masaki Michihata, Shuzo Masui, Yushen Liu, Satoru Takahashi
Precision Engineering
Near-Field Optical Microscopy
article

Uncertainty analysis of microsphere circumference diameter measurement based on Whispering-Gallery-Mode resonance

Masaki Michihata, Shuzo Masui, Yushen Liu, Satoru Takahashi
article en

Abstract

Microspheres are widely used as reference artefacts in microscale three-dimensional metrology, yet accurate diameter measurement remains challenging. This study presents a method for evaluating the circumferential diameter of microspheres based on whispering-gallery-mode (WGM) resonance, in which the sphere itself functions as an optical resonator and its effective resonator length is derived from measured resonance wavelengths. Resonant wavelengths are measured with sub-picometer resolution using evanescent coupling via a micro-optical fiber, and the associated angular, azimuthal, and radial mode numbers are uniquely identified through near-field observation of the surface electric field intensity distribution. A Monte Carlo–based uncertainty analysis is performed to quantify the contributions of resonance wavelength measurement, refractive index variation, and mode identification. Experimental results demonstrate nanometer-scale consistency among independently evaluated modes, and the expanded uncertainty of the circumferential diameter measurement is on the order of several 10 nm. The proposed method provides a reliable and high-precision approach for microsphere diameter evaluation, suitable for dimensional metrology and calibration applications. • A circumferential diameter measurement method for microspheres based on whispering-gallery-mode resonance is proposed. • Angular, azimuthal, and radial mode numbers are uniquely identified via near-field electric field observation. • Monte Carlo–based uncertainty analysis quantitatively evaluates wavelength, refractive index, and mode identification effects. • Nanometer-scale consistency and expanded uncertainty of several tens of nanometers are demonstrated.

Precision Engineering
The University of Tokyo (JP)
Precise Measurement Technology Promotion Foundation, Japan Society for the Promotion of Science
Openalex Percentile: Top 9%
Near-Field Optical Microscopy
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