Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening

Over the past five decades, our understanding of Single-Event Effects (SEEs) has evolved from isolated observations of radiation-induced anomalies into a mature, multidisciplinary field of research [...]

Authors

C. Martinella (ORCID: https://orcid.org/0000-0003-3476-4802)
Ygor Quadros De Aguiar

Institutions

Institut d'Électronique et des Systèmes (FR)
European Organization for Nuclear Research (CH)

Publication Details

Journal: Electronics
Published: 2026-04-30
DOI: https://doi.org/10.3390/electronics15091903
Primary Topic: Radiation Effects in Electronics
Type: article
Field-Weighted Citation Impact: 0.00

Controls

|||

ALL TIME

JAN

FEB

MAR

APR

MAY

JUN

JUL

AUG

SEP

OCT

article

Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening

C. Martinella, Ygor Quadros De Aguiar

Apr 30, 2026

Electronics

Radiation Effects in Electronics

article

Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening

C. Martinella, Ygor Quadros De Aguiar

April 30, 2026article en

Abstract

ElectronicsVol. 15(9)

Institut d'Électronique et des Systèmes (FR), European Organization for Nuclear Research (CH)

Openalex Percentile: Top 14%

Radiation Effects in Electronics

DOI Open Access PDF OpenAlex

AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening — C. Martinella, Ygor Quadros De Aguiar · Electronics (2026) | TGRS Research Map | TGRS