Lattice thermal conductivity below Cahill limit: Negative thermal expansion in Pr doped BiCuSeO

Fundamental understanding of lattice softening and phonon transport in crystalline solids is crucial for thermoelectric applications, since the design of thermally insulating solids has gained significant interest over the years. In this work, we demonstrate strain induced lattice softening through negative thermal expansion (NTE) in Pr doped BiCuSeO, which breaks the theoretical Cahill limit, κlmin ∼ 0.55 W m−1 K−1, achieving a low κl of 0.24 W m−1 K−1 at 740 K. The Differential Scanning Calorimetry (DSC) and Raman analyses experimentally confirm NTE-driven lattice softening, which influences glass-like thermal transport beyond the theoretical limit. Meanwhile, the negative Gruneisen parameter (−1.13) calculated from reduced average sound velocity, νs∼1870 ms−1, with shrinkage of cell volume illustrates the NTE behavior. Furthermore, the observed weak carrier–phonon coupling μW/κl indicates the absence of conventional carrier scattering through NTE, which leads to a 54% increment in zT compared to undoped BiCuSeO (0.5 at 740 K) for Bi0.97Pr0.03CuSeO.

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Publication Details

Journal
Applied Physics Letters
Published
2026-04-27
DOI
https://doi.org/10.1063/5.0318901
Primary Topic
Thermal Expansion and Ionic Conductivity
Type
article
Field-Weighted Citation Impact
0.00

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article

Lattice thermal conductivity below Cahill limit: Negative thermal expansion in Pr doped BiCuSeO

M Navaneethan, K. P. Mohamed Jibri, J Archana, R. Amuthan
Applied Physics Letters
Thermal Expansion and Ionic Conductivity
article

Lattice thermal conductivity below Cahill limit: Negative thermal expansion in Pr doped BiCuSeO

M Navaneethan, K. P. Mohamed Jibri, J Archana, R. Amuthan
article en

Abstract

Fundamental understanding of lattice softening and phonon transport in crystalline solids is crucial for thermoelectric applications, since the design of thermally insulating solids has gained significant interest over the years. In this work, we demonstrate strain induced lattice softening through negative thermal expansion (NTE) in Pr doped BiCuSeO, which breaks the theoretical Cahill limit, κlmin ∼ 0.55 W m−1 K−1, achieving a low κl of 0.24 W m−1 K−1 at 740 K. The Differential Scanning Calorimetry (DSC) and Raman analyses experimentally confirm NTE-driven lattice softening, which influences glass-like thermal transport beyond the theoretical limit. Meanwhile, the negative Gruneisen parameter (−1.13) calculated from reduced average sound velocity, νs∼1870 ms−1, with shrinkage of cell volume illustrates the NTE behavior. Furthermore, the observed weak carrier–phonon coupling μW/κl indicates the absence of conventional carrier scattering through NTE, which leads to a 54% increment in zT compared to undoped BiCuSeO (0.5 at 740 K) for Bi0.97Pr0.03CuSeO.

Applied Physics LettersVol. 128(17)
SRM Institute of Science and Technology (IN)
SRM Institute of Science and Technology, Council of Scientific and Industrial Research, India, Science and Engineering Research Board
Openalex Percentile: Top 9%
Thermal Expansion and Ionic Conductivity
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