A Novel Parameter Extraction Technique for Off-state Equivalent Circuit Model of Body-Contact PD-SOI MOSFETs

To directly extract the model parameters of the physical off-state small-signal equivalent circuit of body-contact PD-SOI MOSFETs, novel extraction equations are derived from Y -parameter equations approximated in both low and high-frequency regions. Unlike conventional direct extraction methods that require additional test patterns or measurements under varying bias conditions, the proposed technique enables direct extraction of all off-state equivalent circuit parameters using only a single S-parameter measurement, making it much simpler. The off-state model built with this novel extraction method shows excellent agreement with measured S-parameters in the wide bias range and the frequency range from 100 MHz to 40 GHz.

Authors

Publication Details

Journal
JSTS Journal of Semiconductor Technology and Science
Published
2026-04-28
DOI
https://doi.org/10.5573/jsts.2026.26.2.114
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
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article

A Novel Parameter Extraction Technique for Off-state Equivalent Circuit Model of Body-Contact PD-SOI MOSFETs

Seonghearn Lee, Seunghun Yi
JSTS Journal of Semiconductor Technology and Science
Advancements in Semiconductor Devices and Circuit Design
article

A Novel Parameter Extraction Technique for Off-state Equivalent Circuit Model of Body-Contact PD-SOI MOSFETs

Seonghearn Lee, Seunghun Yi
article en

Abstract

To directly extract the model parameters of the physical off-state small-signal equivalent circuit of body-contact PD-SOI MOSFETs, novel extraction equations are derived from Y -parameter equations approximated in both low and high-frequency regions. Unlike conventional direct extraction methods that require additional test patterns or measurements under varying bias conditions, the proposed technique enables direct extraction of all off-state equivalent circuit parameters using only a single S-parameter measurement, making it much simpler. The off-state model built with this novel extraction method shows excellent agreement with measured S-parameters in the wide bias range and the frequency range from 100 MHz to 40 GHz.

JSTS Journal of Semiconductor Technology and ScienceVol. 26(2)
Openalex Percentile: Top 8%
Advancements in Semiconductor Devices and Circuit Design
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