Application of Laser Assisted Soldering for Replacing Massive Reflow in SBM Process

Abstract This study analyzes the feasibility of introducing laser assisted soldering (LAS) into solder ball mounting (SBM) process. The vertical cavity surface emitting laser (VcSEL) adopted in this LAS system radiates an infrared (IR) laser beam with a wavelength of 980nm over a 240mm×95mm area. The workable range of LAS applicable to SBM process has been determined by varying laser power and radiating time. Among the tested conditions, the most favorable condition is 12000W for 1.5s. Before SBM, the average warpage of packages used in this experiment was 240.3μm. The average warpage of them has increased to 271.9μm after SBM using LAS, but it has increased to 350.4μm after SBM using massive reflow (MR). For LAS, X-section result of solder ball showed that the intermetallic compound (IMC) layer between the ENEPIG pad and the solder was undetectable by scanning electron microscopy (SEM) inspection, but for MR, the IMC layer thickness was thicker than 2um. The reason why the solder balls mounted with LAS have 11.9% stronger ball shear strength than that with MR is expected to be because IMC layer was not detected. Temperature cycle (TC) test results also showed that solder balls mounted by using LAS had thinner IMC than MR even after 1000 cycles of TC test. Therefore, LAS can be considered as a good alternative to MR in SBM process because it has advantages such as improved warpages, bond properties, and shorter process time.

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Publication Details

Journal
Journal of Electronic Packaging
Published
2026-04-27
DOI
https://doi.org/10.1115/1.4071751
Primary Topic
Electronic Packaging and Soldering Technologies
Type
article
Field-Weighted Citation Impact
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article

Application of Laser Assisted Soldering for Replacing Massive Reflow in SBM Process

Jongchan Park, Tae-Keun Lee, Chung-Lyul Ahn
Journal of Electronic Packaging
Electronic Packaging and Soldering Technologies
article

Application of Laser Assisted Soldering for Replacing Massive Reflow in SBM Process

Jongchan Park, Tae-Keun Lee, Chung-Lyul Ahn
article en

Abstract

Abstract This study analyzes the feasibility of introducing laser assisted soldering (LAS) into solder ball mounting (SBM) process. The vertical cavity surface emitting laser (VcSEL) adopted in this LAS system radiates an infrared (IR) laser beam with a wavelength of 980nm over a 240mm×95mm area. The workable range of LAS applicable to SBM process has been determined by varying laser power and radiating time. Among the tested conditions, the most favorable condition is 12000W for 1.5s. Before SBM, the average warpage of packages used in this experiment was 240.3μm. The average warpage of them has increased to 271.9μm after SBM using LAS, but it has increased to 350.4μm after SBM using massive reflow (MR). For LAS, X-section result of solder ball showed that the intermetallic compound (IMC) layer between the ENEPIG pad and the solder was undetectable by scanning electron microscopy (SEM) inspection, but for MR, the IMC layer thickness was thicker than 2um. The reason why the solder balls mounted with LAS have 11.9% stronger ball shear strength than that with MR is expected to be because IMC layer was not detected. Temperature cycle (TC) test results also showed that solder balls mounted by using LAS had thinner IMC than MR even after 1000 cycles of TC test. Therefore, LAS can be considered as a good alternative to MR in SBM process because it has advantages such as improved warpages, bond properties, and shorter process time.

Journal of Electronic Packaging
Statistics Korea (KR)
Openalex Percentile: Top 8%
Electronic Packaging and Soldering Technologies
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