Low-defect quantum dot lasers directly grown on silicon analyzed using cross-sectional scanning tunneling microscopy and spectroscopy

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HAL (Le Centre pour la Communication Scientifique Directe)
Published
2026-04-12
Primary Topic
Semiconductor Quantum Structures and Devices
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article
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article

Low-defect quantum dot lasers directly grown on silicon analyzed using cross-sectional scanning tunneling microscopy and spectroscopy

Jean‐Christophe Girard, Mingchu Tang, Guillemin Rodary, Konstantinos Papatryfonos et al.
HAL (Le Centre pour la Communication Scientifique Directe)
Semiconductor Quantum Structures and Devices
article

Low-defect quantum dot lasers directly grown on silicon analyzed using cross-sectional scanning tunneling microscopy and spectroscopy

Jean‐Christophe Girard, Mingchu Tang, Guillemin Rodary, Konstantinos Papatryfonos, Huiyun Liu, And David R. Selviah, Christophe David, Alwyn J. Seeds
article en

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No abstract available for this paper.
HAL (Le Centre pour la Communication Scientifique Directe)
Industry, innovation and infrastructure
Openalex Percentile: Top 14%
Semiconductor Quantum Structures and Devices
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