Cleaning Matters: Impact of Surface Treatment Methods on Solid‐State Nanopore Noise for High Frequency Recording

Noise reduction is a key challenge in solid‐state nanopore experiments, as it directly limits signal resolution and the detectability of translocation events. Low‐frequency noise, mainly caused by surface contamination and charge fluctuations, hampers event recognition, while high‐frequency noise, arising from membrane capacitance, constraints the extraction of structural information. In this study, we systematically compared two established cleaning methods, oxygen plasma, and piranha solution, with multi‐wavelength irradiation, to assess their impact on the noise characteristics of silicon nitride nanopores. The multi‐wavelength irradiation was carried out using a newly developed commercial device specifically designed for cleaning membranes and TEM grids. All methods were applied under literature‐reported conditions and evaluated through current‐time traces, root mean square current (I RMS ) analysis, and noise power density spectra. Oxygen plasma cleaning and piranha solution treatment resulted in a moderate overall noise reduction but were slightly outperformed by multi‐wavelength irradiation achieved. These findings highlight that optimized cleaning and posttreatment protocols can markedly improve signal quality in solid‐state nanopore measurements and suggest that multi‐wavelength irradiation has an untapped potential for this purpose.