Process-integrated in-situ characterization and multiscale modeling of cure-dependent thermo-mechanical behavior of epoxy molding compounds for accurate warpage prediction in advanced semiconductor packaging

Accurate prediction of cure-induced thermo-mechanical deformation in polymer-based composites critically depends on reliable characterization of material property evolution under process-relevant curing conditions. For warpage prediction in advanced semiconductor packages, a liquid-type, highly silica filled epoxy molding compound (EMC) was characterized under molding-relevant thermal and pressure histories. A process-integrated experimental–computational framework is presented that couples in-situ dielectrometry and embedded fiber Bragg grating (FBG) sensing during compression molding with molecular-dynamics (MD)-based multiscale modeling to obtain a self-consistent set of cure- and temperature-dependent thermomechanical properties. Gelation under the applied thermal/pressure history was identified by in-situ dielectrometry. Embedded FBG sensing quantified the post-gel effective cure shrinkage referenced to gelation point as ∼0.102%. A dual-configuration FBG strategy using two concentric cylindrical specimens under ∼1 MPa enabled inverse reconstruction of post-gel Young's modulus evolution, reaching ∼768 MPa at the end of molding dwell. Poisson's ratio evolution of the epoxy network was obtained from stepwise crosslinked MD simulations and upscaled to the EMC composite level using Mori–Tanaka homogenization, separating cure-dependent ν ( α ) during curing from temperature-dependent ν ( T ) during cooling. In addition, the MD-based multiscale predictions show agreement with experimentally quantified effective cure shrinkage and the reconstructed post-gel modulus evolution under the same molding history. Viscoelastic relaxation during cool-down was represented using DMA-derived master curves and time–temperature superposition. The property set was validated through an EMC/Al bi-strip warpage experiment and process FE simulation (3.326 mm predicted vs. 3.393 mm measured; ∼1.97% deviation), enabling quantitative assessment of key contributors to warpage.

Authors

Institutions

Publication Details

Journal
Materials Today Advances
Published
2026-04-21
DOI
https://doi.org/10.1016/j.mtadv.2026.100781
Primary Topic
Epoxy Resin Curing Processes
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Process-integrated in-situ characterization and multiscale modeling of cure-dependent thermo-mechanical behavior of epoxy molding compounds for accurate warpage prediction in advanced semiconductor packaging

Woo-Jin An, Jun-Seop Song, Hak‐Sung Kim, Woong-Kyoo Yoo et al.
Materials Today Advances
Epoxy Resin Curing Processes
article

Process-integrated in-situ characterization and multiscale modeling of cure-dependent thermo-mechanical behavior of epoxy molding compounds for accurate warpage prediction in advanced semiconductor packaging

Woo-Jin An, Jun-Seop Song, Hak‐Sung Kim, Woong-Kyoo Yoo, Jeong-Hyeon Baek, Gyung-Hwan Oh, Ji-Hye Shim
article en

Abstract

Accurate prediction of cure-induced thermo-mechanical deformation in polymer-based composites critically depends on reliable characterization of material property evolution under process-relevant curing conditions. For warpage prediction in advanced semiconductor packages, a liquid-type, highly silica filled epoxy molding compound (EMC) was characterized under molding-relevant thermal and pressure histories. A process-integrated experimental–computational framework is presented that couples in-situ dielectrometry and embedded fiber Bragg grating (FBG) sensing during compression molding with molecular-dynamics (MD)-based multiscale modeling to obtain a self-consistent set of cure- and temperature-dependent thermomechanical properties. Gelation under the applied thermal/pressure history was identified by in-situ dielectrometry. Embedded FBG sensing quantified the post-gel effective cure shrinkage referenced to gelation point as ∼0.102%. A dual-configuration FBG strategy using two concentric cylindrical specimens under ∼1 MPa enabled inverse reconstruction of post-gel Young's modulus evolution, reaching ∼768 MPa at the end of molding dwell. Poisson's ratio evolution of the epoxy network was obtained from stepwise crosslinked MD simulations and upscaled to the EMC composite level using Mori–Tanaka homogenization, separating cure-dependent ν ( α ) during curing from temperature-dependent ν ( T ) during cooling. In addition, the MD-based multiscale predictions show agreement with experimentally quantified effective cure shrinkage and the reconstructed post-gel modulus evolution under the same molding history. Viscoelastic relaxation during cool-down was represented using DMA-derived master curves and time–temperature superposition. The property set was validated through an EMC/Al bi-strip warpage experiment and process FE simulation (3.326 mm predicted vs. 3.393 mm measured; ∼1.97% deviation), enabling quantitative assessment of key contributors to warpage.

Materials Today AdvancesVol. 30
Samsung (South Korea) (KR), Hanyang University (KR), Anyang University (KR)
Ministry of Education, Ministry of Trade, Industry and Energy, Ministry of Science and ICT, South Korea, Samsung
Openalex Percentile: Top 19%
Epoxy Resin Curing Processes
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.