Fast Electrochemical Impedance Characterization via Joint Time-Frequency Distribution of Relaxation Times Inversion

Conventional electrochemical impedance spectroscopy (EIS) can require hours for broadband frequency sweeps. Broadband time-domain excitations accelerate acquisition, but most workflows reconstruct frequency-domain spectra before applying the distribution of relaxation times (DRT) analysis, introducing spectral leakage and discretization artifacts. We present a convex framework that jointly estimates a shared DRT from impedance data and voltage transients within a single Bayesian formulation, incorporating non-negativity and smoothness priors. Regularization parameters are selected by minimizing a K-fold cross-validation objective with residual-based variance re-estimation, solved via Bayesian optimization. On synthetic circuits with up to two generalized constant-phase elements, the method achieves median DRT errors below 5% and impedance errors below 1%, reducing acquisition time by factors of 4–8 relative to stepped-sine protocols.

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Publication Details

Journal
The Journal of Physical Chemistry C
Published
2026-04-16
DOI
https://doi.org/10.1021/acs.jpcc.6c01293
Primary Topic
Electrochemical Analysis and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Fast Electrochemical Impedance Characterization via Joint Time-Frequency Distribution of Relaxation Times Inversion

Francesco Ciucci, Jiapeng Liu
The Journal of Physical Chemistry C
Electrochemical Analysis and Applications
article

Fast Electrochemical Impedance Characterization via Joint Time-Frequency Distribution of Relaxation Times Inversion

Francesco Ciucci, Jiapeng Liu
article en

Abstract

Conventional electrochemical impedance spectroscopy (EIS) can require hours for broadband frequency sweeps. Broadband time-domain excitations accelerate acquisition, but most workflows reconstruct frequency-domain spectra before applying the distribution of relaxation times (DRT) analysis, introducing spectral leakage and discretization artifacts. We present a convex framework that jointly estimates a shared DRT from impedance data and voltage transients within a single Bayesian formulation, incorporating non-negativity and smoothness priors. Regularization parameters are selected by minimizing a K-fold cross-validation objective with residual-based variance re-estimation, solved via Bayesian optimization. On synthetic circuits with up to two generalized constant-phase elements, the method achieves median DRT errors below 5% and impedance errors below 1%, reducing acquisition time by factors of 4–8 relative to stepped-sine protocols.

The Journal of Physical Chemistry CVol. 130(17)
Hong Kong University of Science and Technology (HK), University of Bayreuth (DE)
Sun Yat-sen University, Research Grants Council, University Grants Committee
Openalex Percentile: Top 26%
Electrochemical Analysis and Applications
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