Revealing the Intrinsic Electronic Structure of 2D MoS <sub>2</sub> Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy
Authors
Hyangsook Lee (ORCID: https://orcid.org/0000-0002-1107-9389)
Revealing the Intrinsic Electronic Structure of 2D MoS 2 Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy
Hyangsook Lee, Dong‐Jin Yun, Minsu Seol, Min Seok Yoo et al.
Journal
Small
Topics
2D Materials and Applications
article
Revealing the Intrinsic Electronic Structure of 2D MoS 2 Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy
Hyangsook Lee, Dong‐Jin Yun, Minsu Seol, Min Seok Yoo, Young Mo Sung, K C Kim, Alum Jung, Okkyun Seo, Siwoo Noh, Hyungjun Youn, D H Kim, Myoungho Jeong, Byeong Gyu Chae, Changhoon Jung, Sangjun Lee, Seong Yong Park
article en
Abstract
No abstract available for this paper.
Publication Tag
Small
Institutions
Pohang University of Science and Technology (KR), Samsung (South Korea) (KR), Japan Synchrotron Radiation Research Institute (JP)