Revealing the Intrinsic Electronic Structure of 2D MoS <sub>2</sub> Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy

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Journal
Small
Published
2026-04-16
DOI
https://doi.org/10.1002/smll.202512327
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
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article

Revealing the Intrinsic Electronic Structure of 2D MoS 2 Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy

Hyangsook Lee, Dong‐Jin Yun, Minsu Seol, Min Seok Yoo et al.
Small
2D Materials and Applications
article

Revealing the Intrinsic Electronic Structure of 2D MoS 2 Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy

Hyangsook Lee, Dong‐Jin Yun, Minsu Seol, Min Seok Yoo, Young Mo Sung, K C Kim, Alum Jung, Okkyun Seo, Siwoo Noh, Hyungjun Youn, D H Kim, Myoungho Jeong, Byeong Gyu Chae, Changhoon Jung, Sangjun Lee, Seong Yong Park
article en

Abstract

No abstract available for this paper.
Small
Pohang University of Science and Technology (KR), Samsung (South Korea) (KR), Japan Synchrotron Radiation Research Institute (JP)
Openalex Percentile: Top 22%
2D Materials and Applications
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