Optimisation of EDS quantitative f‐ratio method via ZAF correction
), which arises due to the unknown concentration of the unknown sample. F-ratio models were established based on the P-In, As-Ga, S-Zn, Se-Cd, and S-Fe systems. Quantitative f-ratio analysis was subsequently performed on the binary system As-In and Se-Zn, as well as the ternary system S-As-Fe. The results demonstrate that the ZAF correction f-ratio method achieves satisfactory precision.
Authors
- Xia Song
- Fan Peng (ORCID: https://orcid.org/0000-0002-3382-3498)
- Yiling Huang (ORCID: https://orcid.org/0000-0001-6662-3495)
- Yi Zeng (ORCID: https://orcid.org/0000-0001-5797-1690)
- Y W Sun (ORCID: https://orcid.org/0000-0002-4420-5708)
- Liujia Tian
- Wei Zheng
- Jiayi Chen
Institutions
- Shanghai Polytechnic University (CN)
- Shanghai Institute of Ceramics (CN)
Publication Details
- Journal
- Journal of Microscopy
- Published
- 2026-04-16
- DOI
- https://doi.org/10.1111/jmi.70095
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Key Research and Development Program of China