Dual-Chemical Etching Strategy for Extended-Depth Macroporous GaN: Realizing Pure Quantum Dot Emission for Color-Conversion Applications

Quantum dot (QD)-integrated microlight-emitting diodes (μ-LEDs) have emerged as a promising technology for full-color displays; however, they face a critical challenge in achieving high color purity owing to the leakage of blue excitation light. This leakage mixes with the converted emission, leading to severe optical crosstalk and a degraded color gamut. While porous GaN is a promising solution, the scattering medium formation via electrochemical etching is confined to an n-type GaN layer. However, this structure requires a thick n-GaN layer to completely suppress the blue excitation light. To address this limitation, we have developed a dual-chemical treatment strategy that extends the porous structure to the underlying undoped GaN (u-GaN) layer. First, we optimized the single-step etching process, identifying a medium-doped template (Nd = 6 × 1018 cm–3) as the best scattering medium. Next, an ultraviolet-assisted photoelectrochemical treatment expanded the porous region into the u-GaN layer and increased the porosity to 75%, transforming the morphology into a macroporous structure. This structural evolution achieved a near-unity QD emission ratio of 99.8% with a 37.7-fold reduction in light leakage, offering a viable route toward high-performance, full-color μ-LED displays.

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Publication Details

Journal
ACS Applied Optical Materials
Published
2026-04-16
DOI
https://doi.org/10.1021/acsaom.6c00064
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
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article

Dual-Chemical Etching Strategy for Extended-Depth Macroporous GaN: Realizing Pure Quantum Dot Emission for Color-Conversion Applications

Je-Sung Lee, Chang‐Mo Kang, Jeongwoon Kim, Sugyeong Cha et al.
ACS Applied Optical Materials
GaN-based semiconductor devices and materials
article

Dual-Chemical Etching Strategy for Extended-Depth Macroporous GaN: Realizing Pure Quantum Dot Emission for Color-Conversion Applications

Je-Sung Lee, Chang‐Mo Kang, Jeongwoon Kim, Sugyeong Cha, Seung Hyeok Lee, Hoe-Min Kwak, Jaeyoung Baik, Jaeyong Kwon, Dong-Seon Lee
article en

Abstract

Quantum dot (QD)-integrated microlight-emitting diodes (μ-LEDs) have emerged as a promising technology for full-color displays; however, they face a critical challenge in achieving high color purity owing to the leakage of blue excitation light. This leakage mixes with the converted emission, leading to severe optical crosstalk and a degraded color gamut. While porous GaN is a promising solution, the scattering medium formation via electrochemical etching is confined to an n-type GaN layer. However, this structure requires a thick n-GaN layer to completely suppress the blue excitation light. To address this limitation, we have developed a dual-chemical treatment strategy that extends the porous structure to the underlying undoped GaN (u-GaN) layer. First, we optimized the single-step etching process, identifying a medium-doped template (Nd = 6 × 1018 cm–3) as the best scattering medium. Next, an ultraviolet-assisted photoelectrochemical treatment expanded the porous region into the u-GaN layer and increased the porosity to 75%, transforming the morphology into a macroporous structure. This structural evolution achieved a near-unity QD emission ratio of 99.8% with a 37.7-fold reduction in light leakage, offering a viable route toward high-performance, full-color μ-LED displays.

ACS Applied Optical Materials
Electronics and Telecommunications Research Institute (KR), Gwangju Institute of Science and Technology (KR), Pusan National University (KR)
Openalex Percentile: Top 14%
GaN-based semiconductor devices and materials
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