Noise estimation and suppression in quantitative EMCD measurements

peaks meet the requirements for quantitative analysis. The approach also provides a framework for determining the minimum electron dose necessary for valid measurements and can be generalized to scintillator-based or direct electron detectors. This work advances the reliability of EMCD as a quantitative tool for magnetic characterization at the nanoscale with unknown magnetic structures. The proposed procedures lay the groundwork for improved error handling and SNR optimization in future EMCD studies.

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Publication Details

Journal
Ultramicroscopy
Published
2026-04-15
DOI
https://doi.org/10.1016/j.ultramic.2026.114372
Primary Topic
Electrostatic Discharge in Electronics
Type
article
Field-Weighted Citation Impact
0.00

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article

Noise estimation and suppression in quantitative EMCD measurements

Darius Pohl, Axel Lubk, Bernd Rellinghaus, Sebastian Schneider et al.
Ultramicroscopy
Electrostatic Discharge in Electronics
article

Noise estimation and suppression in quantitative EMCD measurements

Darius Pohl, Axel Lubk, Bernd Rellinghaus, Sebastian Schneider, Hitoshi Makino
article en

Abstract

peaks meet the requirements for quantitative analysis. The approach also provides a framework for determining the minimum electron dose necessary for valid measurements and can be generalized to scintillator-based or direct electron detectors. This work advances the reliability of EMCD as a quantitative tool for magnetic characterization at the nanoscale with unknown magnetic structures. The proposed procedures lay the groundwork for improved error handling and SNR optimization in future EMCD studies.

UltramicroscopyVol. 284
Leibniz Institute for Solid State and Materials Research (DE), Technische Universität Dresden (DE)
Deutsche Forschungsgemeinschaft
Openalex Percentile: Top 19%
Electrostatic Discharge in Electronics
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