Argon Adsorption on MCM-48 Mesoporous Crystal Studied by <i>In Situ</i> Synchrotron Powder X-ray Diffraction

The structure of the silica mesoporous crystal MCM-48 and the argon adsorption process were studied by in situ synchrotron powder X-ray diffraction (XRD). The diffraction intensity data were analyzed using the maximum entropy method (MEM). The Ar adsorption process within the mesopores was directly monitored through changes in the electron density distribution in the sample. The diffraction patterns clearly reflected different stages of adsorption as the gas pressure increased: gradual formation of an adsorbed film on the pore walls at low pressures, followed by stepwise pore filling due to capillary condensation. The real-space imaging of diffraction data presented in this paper is a robust and promising approach for improving our understanding of gas–solid interactions during adsorption and for characterizing the pore structures of mesoporous crystals.

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Journal
The Journal of Physical Chemistry C
Published
2026-04-15
DOI
https://doi.org/10.1021/acs.jpcc.6c00603
Primary Topic
Mesoporous Materials and Catalysis
Type
article
Field-Weighted Citation Impact
0.00

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article

Argon Adsorption on MCM-48 Mesoporous Crystal Studied by In Situ Synchrotron Powder X-ray Diffraction

Masaki Takata, Norihiro Muroyama, 宮坂慶一, Alexander V. Neimark et al.
The Journal of Physical Chemistry C
Mesoporous Materials and Catalysis
article

Argon Adsorption on MCM-48 Mesoporous Crystal Studied by In Situ Synchrotron Powder X-ray Diffraction

Masaki Takata, Norihiro Muroyama, 宮坂慶一, Alexander V. Neimark, Susumu Kitagawa, Ryotaro Matsuda, Osamu Terasaki, Arisa Yoshimura, Yoshiki Kubota, Peter I. Ravikovitch, Masakazu Higuchi
article en

Abstract

The structure of the silica mesoporous crystal MCM-48 and the argon adsorption process were studied by in situ synchrotron powder X-ray diffraction (XRD). The diffraction intensity data were analyzed using the maximum entropy method (MEM). The Ar adsorption process within the mesopores was directly monitored through changes in the electron density distribution in the sample. The diffraction patterns clearly reflected different stages of adsorption as the gas pressure increased: gradual formation of an adsorbed film on the pore walls at low pressures, followed by stepwise pore filling due to capillary condensation. The real-space imaging of diffraction data presented in this paper is a robust and promising approach for improving our understanding of gas–solid interactions during adsorption and for characterizing the pore structures of mesoporous crystals.

The Journal of Physical Chemistry CVol. 130(16)
Rutgers, The State University of New Jersey (US), Osaka Prefecture University (JP), Stockholm University (SE), Tohoku University (JP), Kyoto University (JP), ShanghaiTech University (CN), Applied Nanotech (United States) (US), Department of Physics, Mathematics and Informatics (BY), Material Sciences (United States) (US), Osaka Metropolitan University (JP), Nagoya University (JP), Graduate School USA (US), ExxonMobil (United States) (US)
Ministry of Education, Culture, Sports, Science and Technology, Knut och Alice Wallenbergs Stiftelse, Vetenskapsrådet, Japan Science and Technology Agency, Division of Chemical, Bioengineering, Environmental, and Transport Systems
Openalex Percentile: Top 21%
Mesoporous Materials and Catalysis
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