3D electron diffraction—the missing slice completing nanoscale analysis of organic solar cells in TEM
BM, demonstrates the generality of the method. Our findings underscore the transformative potential of 3D electron diffraction, particularly in analyzing beam-sensitive organic thin films. The method enables correlative structural characterization of organic solar cells and opens pathways for application to a wide range of other nanostructured materials.
Authors
- Larry Lüer (ORCID: https://orcid.org/0000-0001-9952-4207)
- Tobias Unruh (ORCID: https://orcid.org/0000-0002-8903-4850)
- Erdmann Spiecker (ORCID: https://orcid.org/0000-0002-2723-5227)
- Stefanie Rechberger (ORCID: https://orcid.org/0000-0002-0770-0910)
- Johannes Will (ORCID: https://orcid.org/0000-0003-0326-9913)
- Andreas Kuhlmann (ORCID: https://orcid.org/0000-0002-0434-0104)
- Mingjian Wu (ORCID: https://orcid.org/0000-0003-2113-0245)
- Florian Bertram (ORCID: https://orcid.org/0000-0001-9002-4118)
- Hans‐Georg Steinrück
- Irene Kraus
- Christoph J. Brabec (ORCID: https://orcid.org/0000-0002-9440-0253)
- Santanu Maiti
- Konstantin Dengel (ORCID: https://orcid.org/0009-0006-2717-1282)
- Marten Huck
Institutions
- Forschungszentrum Jülich (DE)
- Friedrich-Alexander-Universität Erlangen-Nürnberg (DE)
- Paderborn University (DE)
- Deutsches Elektronen-Synchrotron DESY (DE)
- Helmholtz Institute Erlangen-Nürnberg (DE)
- RWTH Aachen University (DE)
Publication Details
- Journal
- Nature Communications
- Published
- 2026-04-15
- DOI
- https://doi.org/10.1038/s41467-026-70690-y
- Primary Topic
- Organic Electronics and Photovoltaics
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Verband der Chemischen Industrie
- Deutsche Forschungsgemeinschaft
- Deutsches Elektronen-Synchrotron