Leakage-Induced Space-Charge Accumulation and Interfacial Field Redistribution in a Dielectric Nanocapacitor Revealed by <i>Operando</i> Electron Holography
framework based on electron holography for probing nanoscale electrical properties and disentangling competing leakage mechanisms in advanced micro- and nanoscale capacitors.
Authors
- Kilian Gruel (ORCID: https://orcid.org/0000-0001-5314-0152)
- Christophe Gatel (ORCID: https://orcid.org/0000-0001-5549-7008)
- Martin Hÿtch (ORCID: https://orcid.org/0000-0002-9099-0129)
- L Zhang
- R. Serra
- Bérangère Disic
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Fédérale de Toulouse Midi-Pyrénées (FR)
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- CEA Grenoble (FR)
- Spintronique et Technologie des Composants (FR)
- Université Grenoble Alpes (FR)
Publication Details
- Journal
- Nano Letters
- Published
- 2026-04-13
- DOI
- https://doi.org/10.1021/acs.nanolett.6c00753
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Agence Nationale de la Recherche
- H2020 Research Infrastructures