Role of mechanical stress on the electrothermal and OFF state current in scaled FinFET devices

is observed in the n-FinFET due to the self-heating effects. A similar effect is observed in the p-FinFET, where the lattice temperature increases to 357 K at 90% germanium concentrations. Furthermore, the presence of a non-uniform electric field creates local quantum confinement of charge carriers in the channel, altering the band gap and intensifying the GIDL component in the n-/p-FinFET.

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Publication Details

Journal
Scientific Reports
Published
2026-04-11
DOI
https://doi.org/10.1038/s41598-026-46949-1
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
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article

Role of mechanical stress on the electrothermal and OFF state current in scaled FinFET devices

Rajan Kumar Pandey, Shubham
Scientific Reports
Advancements in Semiconductor Devices and Circuit Design
article

Role of mechanical stress on the electrothermal and OFF state current in scaled FinFET devices

Rajan Kumar Pandey, Shubham
article en

Abstract

is observed in the n-FinFET due to the self-heating effects. A similar effect is observed in the p-FinFET, where the lattice temperature increases to 357 K at 90% germanium concentrations. Furthermore, the presence of a non-uniform electric field creates local quantum confinement of charge carriers in the channel, altering the band gap and intensifying the GIDL component in the n-/p-FinFET.

Scientific Reports
Vellore Institute of Technology University (IN)
Affordable and clean energy
Openalex Percentile: Top 20%
Advancements in Semiconductor Devices and Circuit Design
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