Silicon Dioxide Multi-Mode Interference Spectrometers
A multi-mode interferometer (MMI) spectrometer is a type of reconstructive micro-spectrometer based on imaging light propagation patterns in MMI waveguides. A waveguide scattering surface accentuates imaging light patterns in the multi-mode interferometer. This technology has been proven with an SU-8 core waveguide with an etched SU-8 nanograss scattering surface. This paper describes our creation of a fully silicon-based spectrometer using a silica core MMI waveguide. Scattering features were created in silica using SU-8 nanograss as an etch mask in a reactive ion etch (RIE). With optimized etch parameters, the silica core MMI spectrometer achieved an SNR of three with an incident light power of -68 dBm, which was almost 6 dB lower than designs with an SU-8 core.
Authors
- Denghui Pan
- Aaron R. Hawkins (ORCID: https://orcid.org/0000-0002-3882-0771)
- Helio Ramollari
- Thomas D. Yuzvinsky (ORCID: https://orcid.org/0000-0001-5708-2877)
- James G. Harkness
- Holger Schmidt (ORCID: https://orcid.org/0000-0003-2340-8108)
Institutions
- Brigham Young University (US)
- University of California, Santa Cruz (US)
Publication Details
- Journal
- Micromachines
- Published
- 2026-04-07
- DOI
- https://doi.org/10.3390/mi17040453
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation