Measuring diffusion in strongly coupled systems using differential dynamic microscopy
Measuring diffusion in strongly coupled systems is challenging due to collective interactions and dynamic heterogeneity, which limit the effectiveness of traditional methods. We propose a novel differential dynamic microscopy approach based on short-time dynamics, which directly extracts diffusion coefficients by focusing on short-time behavior, avoiding the effects of dynamic heterogeneity in strongly coupled systems without requiring particle tracking. Using Langevin simulations of dusty plasmas, we validate the method by comparing it with theoretical results. This approach provides a new pathway for precise diffusion measurements in strongly interacting systems and offers a reliable framework for studying transport in complex, correlated environments.
Authors
- Dietmar Block (ORCID: https://orcid.org/0000-0001-6939-2514)
- Y. Liu
Institutions
- Christian-Albrechts-Universität zu Kiel (DE)
Publication Details
- Journal
- Physics of Plasmas
- Published
- 2026-04-01
- DOI
- https://doi.org/10.1063/5.0312890
- Primary Topic
- Dust and Plasma Wave Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Deutsche Forschungsgemeinschaft
- China Scholarship Council