Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials

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Publication Details

Journal
eCommons (Cornell University)
Published
2026-04-03
DOI
https://doi.org/10.7298/4mwm-jf44
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
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article

Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials

Michael Colletta
eCommons (Cornell University)
Advanced Electron Microscopy Techniques and Applications
article

Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials

Michael Colletta
article en

Abstract

No abstract available for this paper.
eCommons (Cornell University)
Cornell University (US)
Openalex Percentile: Top 20%
Advanced Electron Microscopy Techniques and Applications
DOIOpen Access PDFOpenAlex
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