Dual‐Branch Deep Neural Network for FLIM Parameter Estimation

Fluorescence lifetime imaging microscopy (FLIM) is a powerful tool for studying molecular interactions and cellular microenvironments. Conventional lifetime estimation relies on curve fitting, a computationally intensive and noise‐sensitive process. To address these challenges, we developed a dual‐branch deep learning‐based framework for fit‐free estimation of FLIM parameters. It integrates multitasking and knowledge‐informed learning to improve accuracy and robustness. The dual‐branch model consists of an autoencoder (AE) and a convolutional neural network. The AE processes decay traces to generate a reconstruction and a latent representation, which is subsequently fed into the CNN to predict fluorescence lifetimes and abundances. To overcome the limitation of scarce experimental data, we constructed a training dataset by combining simulated and experimental traces. The method was first validated with a leave‐one‐IRF‐out cross‐validation on simulated data to confirm its capacity to generalize across instrument response functions (IRFs). Next, we evaluated the method on experimental data, with the training data from different proportions of simulated and experimental decays. Compared to baseline CNN and the FLIMview software (curve‐fitting based), the proposed model demonstrated superior performance even with limited experimental data. These findings underscore the potential of deep learning to enable scalable, real‐time FLIM analysis.

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Publication Details

Journal
Advanced Photonics Research
Published
2026-04-01
DOI
https://doi.org/10.1002/adpr.202500300
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
Field-Weighted Citation Impact
0.00

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Dual‐Branch Deep Neural Network for FLIM Parameter Estimation

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Advanced Fluorescence Microscopy Techniques
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Dual‐Branch Deep Neural Network for FLIM Parameter Estimation

Thomas Wilhelm Bocklitz, Jens Haueisen, Matthias Klemm, Kathrin Groeneveld, Mou Adhikari, Ralf Mrowka, Shuxia Guo
article en

Abstract

Fluorescence lifetime imaging microscopy (FLIM) is a powerful tool for studying molecular interactions and cellular microenvironments. Conventional lifetime estimation relies on curve fitting, a computationally intensive and noise‐sensitive process. To address these challenges, we developed a dual‐branch deep learning‐based framework for fit‐free estimation of FLIM parameters. It integrates multitasking and knowledge‐informed learning to improve accuracy and robustness. The dual‐branch model consists of an autoencoder (AE) and a convolutional neural network. The AE processes decay traces to generate a reconstruction and a latent representation, which is subsequently fed into the CNN to predict fluorescence lifetimes and abundances. To overcome the limitation of scarce experimental data, we constructed a training dataset by combining simulated and experimental traces. The method was first validated with a leave‐one‐IRF‐out cross‐validation on simulated data to confirm its capacity to generalize across instrument response functions (IRFs). Next, we evaluated the method on experimental data, with the training data from different proportions of simulated and experimental decays. Compared to baseline CNN and the FLIMview software (curve‐fitting based), the proposed model demonstrated superior performance even with limited experimental data. These findings underscore the potential of deep learning to enable scalable, real‐time FLIM analysis.

Advanced Photonics ResearchVol. 7(4)
Technische Universität Ilmenau (DE), Leibniz Institute of Photonic Technology (DE), Jena University Hospital (DE), Thuringian Institute of Sustainability and Climate Protection (Germany) (DE), Friedrich Schiller University Jena (DE)
Freistaat Thüringen, European Commission, Bundesministerium für Bildung und Forschung, Leibniz-Gemeinschaft, European Regional Development Fund, European Social Fund
Openalex Percentile: Top 30%
Advanced Fluorescence Microscopy Techniques
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