Inhomogeneous Charge Carrier Density in Wafer-Scale MoS <sub>2</sub> Caused by Locally Varying Substrate Doping

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Journal
ACS Applied Materials & Interfaces
Published
2026-04-01
DOI
https://doi.org/10.1021/acsami.6c00562
Primary Topic
2D Materials and Applications
Type
article
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article

Inhomogeneous Charge Carrier Density in Wafer-Scale MoS 2 Caused by Locally Varying Substrate Doping

Henrik Myja, W. Mertin, Benjamin Groven, Mohamed Abdelbaky et al.
ACS Applied Materials & Interfaces
2D Materials and Applications
article

Inhomogeneous Charge Carrier Density in Wafer-Scale MoS 2 Caused by Locally Varying Substrate Doping

Henrik Myja, W. Mertin, Benjamin Groven, Mohamed Abdelbaky, Tilmar Kümmell, Gerd Bacher, Pierre Morin, Henry Medina Silva, Sofiia Ustenko, Pawan Kumar
article en

Abstract

No abstract available for this paper.
ACS Applied Materials & InterfacesVol. 18(14)
University of Duisburg-Essen (DE)
Openalex Percentile: Top 30%
2D Materials and Applications
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