Optimization of Processing Parameters and Application Performance Evaluation of a High Thermal Conductivity, Low Thermal Resistance Gel
and a bonding strength of 0.248 MPa, outperforming commercial counterparts and demonstrating promising application potential. It was further concluded, through comparisons of curing rheology and long-term reliability evolution with commercial counterparts, that the self-developed thermal conductive gel possesses enhanced stability and reliability. This study provides a practical reference for the development and engineering application of high thermal conductivity, low thermal resistance gels.
Authors
- Du Hong
- Yuwen Xu (ORCID: https://orcid.org/0000-0001-8987-3614)
- Tingxin Chen
- Wenfei Wang
- Liangjun Liu
- Minghua Jiang
- Haibing Yang
Institutions
- University of Electronic Science and Technology of China (CN)
- Dongguan University of Technology (CN)
- China Electronic Product Reliability and Environmental Test Institute (CN)
- South China University of Technology (CN)
Publication Details
- Journal
- Gels
- Published
- 2026-03-31
- DOI
- https://doi.org/10.3390/gels12040293
- Primary Topic
- Thermal properties of materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00